Pogo Pin High-current Probe P350(300) Series for Electronic Test Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc. High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments. High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P350(300). This probe can withstand the current up to 24 Amps. And its typical maximum contact resistance is 70 milliohms. The materials used for the construction of this high-current test probe are different for each component: The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase. The spring is made of gold plated music wire. The plunger is made of beryllium copper, then gold and nickel plated. For details, please check parameters in below table. Technical Specifications Recommended Current Rating: 24 amps, continuous Contact Resistance: 70 milliohms, max Full Stroke: 5.5mm Rated Stroke: 3.6 mm Spring Force: 340 gf at load 3.6 mm Company Information: Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Semiconductor Test Probe Pogo Pin SCPC035 Series for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPC035 we will introduce is 0.35 mm in barrel diameter and 7.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2.5 amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.5 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.5 mm, the loaded force is about 18 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel Phosphor Bronze, Au on Ni Plated Bottom Plunger Beryllium Copper, Au on Ni Plated Top Plunger Beryllium Copper, Au on Ni Plated Spring SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating 2.5 amps Contact Resistance 100 milliohms max Bandwidth 5.8 GHz at -1dB Inductance 1MHZ at -0.01039 uH Captance 1MHZ at 2.35287 uF Specifications: Full Stroke 1 mm Rated Stroke 0.5 mm Spring Force 18 �±5 gf at load 0.5 mm Mechanical Life about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Gold-plated Probe Pogo Pin PE100(90) Series for In-circuit Test In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PE100(90) series here. Its test center is 100 mil. The diameter is 1.36 mm and the total length is 34 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 2.54 mm (100 mil) Current Rating: 3 Amps, continuous Contact Resistance: 30 milliohms Mounting Hole Size: Diameter 1.75 mm Full Stroke: 6.5 mm Rated Stroke: 4.3 mm Spring Force: 284 gf (10 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Double-Sided Spring Pogo Pin Test Probe SCPC031 Applied to Chip Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPC031 we will introduce is 0.31 mm in barrel diameter and 6.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 150 milliohms. The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 25 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 1.5 amps Contact Resistance: 150 milliohms max Bandwidth: 7.5 GHz at -1dB Inductance: 1MHZ at -0.05856 uH Captance: 1MHZ at 0.434274 uF Specifications: Full Stroke: 1 mm Rated Stroke: 0.65 mm Spring Force: 25�±5 gf at load 0.65 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
In-circuit Test Probe Pogo Pin P156 Series for PCB Assembly Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQ156 series here. Its test center is 156 mil. The diameter is 2.36 mm and the total length is 33.79 mm. Various tip styles, for example, B, C, G, J, K, L, T, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, WW and WW-L, to fit each test probe For details, please check below parameters. Technical Specifications Recommended Minimum Center: 3.96 mm (156 mil) Current Rating: 5 Amps, continuous Contact Resistance: 50 milliohms Mounting Hole Size: 2.75 mm Full Stroke: 6.35 mm Rated Stroke: 4.32 mm Spring Force: 113/198/255/285 gf (4/7/9/10 oz) Materials Receptacle: Phosphor Bronze, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
Electronic Test Probe Pogo Pin PC50 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PC50 series here. Its test center is 50 mil, namely 1.27 mm. The diameter is 0.78 mm and the total length is 43.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, SW and CRW, to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 60 milliohms Mounting Hole Size: 1 mm Full Stroke: 6.4 mm Rated Stroke: 4.3 mm Spring Force: 100/110/150/200 gf (3.6/4/5.4/7.2 oz) Materials Receptacle: Phosphor Bronze, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring:� Music Wire, Gold Plated Plunger: SK4, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
High-current Probe Pogo Pin P265 Series for Electronic Test Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc. High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments. High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P265. This probe can withstand the current up to 24 Amps. And its typical maximum contact resistance is 50 milliohms. The materials used for the construction of this high-current test probe are different for each component: The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase. The spring is made of gold plated stainless steel. The plunger is made of beryllium copper, then gold and nickel plated. For details, please check parameters in below table. Technical Specifications Recommended Current Rating: 24 amps, continuous Contact Resistance: 50 milliohms, max Full Stroke: 5.3 mm Rated Stroke: 3.5 mm Spring Force: 220 gf (7 oz) at load 3.5 mm Company Information: Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Double-sided Spring Pogo Pin Test Probe SCPC058 for IC Test Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPC058 we will introduce is 0.58 mm in barrel diameter and 8.85 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from SUS304 plated with gold and nickel. This double-sided spring pogo pin could withstand the current up to 4 amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1.2 mm. But it is better to be pressed at a distance of 0.8 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.8 mm, the loaded force is about 35 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: Beryllium Copper, Au on Ni Plated Spring: SUS304, Au on Ni Plated Electronic Specification: Current Rating: 4 amps Contact Resistance: 100 milliohms max Bandwidth: 9.3 GHz at -1dB Inductance: 1MHZ at -0.02158 uH Captance: 1MHZ at 1.4027 uF Specifications: Full Stroke: 1.2 mm Rated Stroke: 0.8 mm Spring Force: 35�±7 gf at load 0.8 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Single-headed Pogo Pin Test Probe PQ50 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQ50 series here. Its diameter is 0.78 mm and the total length is 34.6 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 60 milliohms Mounting Hole Size: Diameter 1 mm Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 85 gf (3 oz) /122 gf (4 oz)/ 150 gf (5.5 oz) at load 4.3 mm Materials Receptacle: Phosphor Bronze, Au on Ni Plated Contact Barrel: Phosphor Bronze, Au on Ni Plated Spring: Music Wire, Au on Ni Plated Plunger: Beryllium Copper, Gold Plated or Nickel Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Wire Harness Probe Pogo Pin CHD136 for the Tests of Automotive Industry Harness probes are mainly used directly or for the tests of the automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CHD136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel. This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 7 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 255 gf, namely 9 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 7 mm Rated Stroke: 4.6 mm Spring Force: 255�±75 gf (9 oz) at load 4.6 mm Materials (plated) Barrel: Brass, Au on Ni Plated Plunger: Beryllium Copper, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Double-ended Pogo Pin Test Probe SCPA058 Series for Semiconductor Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. SCPA058 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. Its parameters are as below. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: Beryllium Copper, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 3.5 Amps Contact Resistance: 100 milliohms, max Bandwidth: 8.5 GHz at -1dB Propagation Delay: 21 ps Inductive Reactance: 1MHZ at -0.02506 uH Capacitive Reactance: 1MHZ at -1.01245 uF Specifications: Full Stroke: 1.1 mm Rated Stroke: 0.65 mm Spring Force: 25�±7 gf at load 0.65 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Gold Plated Pogo Pin PCBA Probe PE75(PO) Series for In-circuit Test In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PE75(PO) series here. Its test center is 75 mil. The diameter is 1 mm and the total length is 33 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.91 mm (75 mil) Current Rating: 3 Amps, continuous Contact Resistance: 40 milliohms Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 155 gf (5.5 oz)/203 gf (7.2 oz)/227 gf (8 oz)/300 gf (10 oz) Materials Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
PCBA Test Probe Pogo Pin PL75 Series Applied to ICT In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PL75 series here. Its test center is 75 mil. The diameter is 1.02 mm and the total length is 27.83 mm. Various tip styles, for example, H, K, L, BK, etc., are available for test probes. There are roughly six types of receptacles, namely CR, VCR, SC, VSC, WW and VWW to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.91 mm (75 mil) Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Mounting Hole Size: Diameter 1.35 mm Full Stroke: 4 mm Rated Stroke: 2.54 mm Spring Force: 113 gf (4 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper/SK4, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Spring-loaded Pogo Pin In-circuit Test Probe PICT102-BK(7.6) for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PICT102-BK(7.6) series here. Its barrel diameter is 1.02 mm and the total length is 33 mm. The barrel of this pogo pin is made from phosphor bronze plated with gold and nickel. The plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This test probe could withstand the current up to 3 Amps. The typical maximal contact resistance is about 50 milliohms. The plunger can be pressed at a distance of up to 6.8 mm. But it is better to be pressed at a distance of 4.3 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 4.3 mm, the loaded force is about 205 gf, which fluctuates to a tolerance. For details, please check below parameters. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 6.8 mm Rated Stroke: 4.3 mm Spring Force: 205 gf (7 oz) at load 4.3 mm Materials Contact Barrel: Phosphor Bronze, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Plunger: SK4, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Semiconductor Test Probe Spring-Loaded Pogo Pin SCPA031(21) for Chip Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA031(21) we will introduce is 0.31 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 0.7 mm. But it is better to be pressed at a distance of 0.45 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.45 mm, the loaded force is about 20 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: Beryllium Copper, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 2 amps Contact Resistance: 100 milliohms max Bandwidth: 7.4 GHz at -1dB Inductive Reactance: 1MHZ at -0.05996 uH Capacitive Reactance: 1MHZ at 0.425647 uF Specifications: Full Stroke: 0.7 mm Rated Stroke: 0.45 mm Spring Force: 20 6 gf at load 0.45 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Pogo Pin Semiconductor Test Probe SCPA101 for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA085 we will introduce is 1.01 mm in barrel diameter and 12.8 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This double-ended pogo pin could withstand the current up to 3 amps. The typical maximal contact resistance is about 120 milliohms. The plunger can be pressed at a distance of up to 2 mm. But it is better to be pressed at a distance of 1.3 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 1.3 mm, the loaded force is about 20 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: Beryllium Copper, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 3 amps Contact Resistance: 120 milliohms max Bandwidth: 11.7 GHz at -1dB Inductive Reactance: 1MHZ at -0.02219 uH Capacitive Reactance: 1MHZ at 1.04567 uF Specifications: Full Stroke: 2 mm Rated Stroke: 1.3 mm Spring Force: 20�±4 gf at load 1.3 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
In-circuit Test Probe Spring-loaded Pogo Pin PE100(115) for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PE100(115) series here. Its test center is 100 mil. The diameter is 1.36 mm and the total length is 36.5 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 2.54 mm (100 mil) Current Rating: 3 Amps, continuous Contact Resistance: 30 milliohms Mounting Hole Size: Diameter 1.75 mm Full Stroke: 6.5 mm Rated Stroke: 4.3 mm Spring Force: 200 gf (7.2 oz)/255 gf (9 oz)/284 gf (10 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Double-sided Spring Pogo Pin Test Probe SCPA030 Series Applied to IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA030 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from stainless steel plated with gold and nickel. This probe pin could withstand the current up to 1.5 Amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 2 mm. But it is better to be pressed at a distance of 0.85 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.85 mm, the loaded force is about 10 gf or 20 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: SK4, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SUS304, Au on Ni Plated Electronic Specification: Current Rating: 1.5 amps Contact Resistance: 100 milliohms max Bandwidth: 9.3 GHz at -1dB Inductance: 1MHZ at -0.02829 uH Captance: 1MHZ at -0.609436 uF Specifications: Full Stroke: 2 mm Rated Stroke: 0.85 mm Spring Force: 10�± 3 gf at load 0.85 mm, 20�± 6 gf at load 0.85 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Cable Harness Probe Pogo Pin CHL165-J6(8.5) for the Tests of Automotive Industry Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CHL165-J6(8.5) harness probe we will introduce here is 1.65 mm in diameter and 36 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel. This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 100 milliohms. It is suggested the plunger be pressed at a distance of 5.5 mm at most when this probe works, although the plunger can move as far as 8.5 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 5.5 mm, its loaded force is about 142 gf, namely 5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. For details, please check below parameters. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 100 milliohms Full Stroke: 8.5 mm Rated Stroke: 5.5 mm Spring Force: 142�±45 gf (5 oz) at load 5.5 mm Materials (plated) Barrel: Brass, Au on Ni Plated Plunger: Beryllium Copper, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Electronic Test Probe Double-ended Pogo Pin SCPE025 Series for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPE025 we will introduce is 0.25 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 0.5 Amp. The typical maximal contact resistance is about 250 milliohms. The plunger can be pressed at a distance of up to 1.9 mm. But it is better to be pressed at a distance of 1.25 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 1.25 mm, the loaded force is about 12 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze/ Gold Clad Phosphor Bronze, Au on Ni Plated X: Bottom (Plunger 1): SK4, Au on Ni Plated Y: Top (Plunger 2): SK4, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 0.5 amp Contact Resistance: 250 milliohms max Bandwidth: 10.8 GHz at -1dB Inductive Reactance: 1MHZ at -0.07234 uH Capacitive Reactance: 1MHZ at 0.329458 uF Specifications: Full Stroke: 1.9 mm Rated Stroke: 1.25 mm Spring Force: 12 �±4 gf at load 1.25 mm Mechanical Life: about 100000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
