In-circuit Test Probe Spring-loaded Pogo Pin PE100(115) for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PE100(115) series here. Its test center is 100 mil. The diameter is 1.36 mm and the total length is 36.5 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 2.54 mm (100 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 30 milliohms
Mounting Hole Size: Diameter 1.75 mm
Full Stroke: 6.5 mm
Rated Stroke: 4.3 mm
Spring Force: 200 gf (7.2 oz)/255 gf (9 oz)/284 gf (10 oz)
Materials
Receptacle: Brass, Gold Plated
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper, Nickel Plated or Gold Plated
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
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Oxygen Concentrator - 0.5-10L/Min Purityï¼? 96% Compressor Life - 25000hours Sound Level 60dB Screen - LED Segment real-time display Power comsumption - 500VA Net Weight - 23k Gross weight:27kg
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This recertified Medical MD Oxygen Cylinder is perfect for professional or personal home oxygen use. With a 14.6 cu ft capacity,this medical oxygen cylinder is perfect for portability and smaller spaces. This lightweight, easy to transport aluminum requalified cylinder is DOT approved, and ready for medical or industrial use. It comes fitted with a CGA870 post valve installed and a freshly painted dome in a Medical Green color for easy identification. PREMIUM CONSTRUCTION Reconditioned High-quality aluminum body Clearcoat protected Medical green rust-resistant painted dome CGA870 medical post valve installed Approximately 4.4â?³ in diameter x 16.3â?³ in height* (with valve) Weighs approximately 6 pounds Capacity 14.6 cubic foot 2015 PSI service / 3360 PSI test pressure Stamped DOT-3AL2015 5-year retest interval Recertified test within 180 days prior to shipment
Gold-plated Probe Pogo Pin PE100(90) Series for In-circuit Test In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PE100(90) series here. Its test center is 100 mil. The diameter is 1.36 mm and the total length is 34 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 2.54 mm (100 mil) Current Rating: 3 Amps, continuous Contact Resistance: 30 milliohms Mounting Hole Size: Diameter 1.75 mm Full Stroke: 6.5 mm Rated Stroke: 4.3 mm Spring Force: 284 gf (10 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.