Single-headed Pogo Pin Test Probe PQ50 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQ50 series here. Its diameter is 0.78 mm and the total length is 34.6 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 60 milliohms Mounting Hole Size: Diameter 1 mm Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 85 gf (3 oz) /122 gf (4 oz)/ 150 gf (5.5 oz) at load 4.3 mm Materials Receptacle: Phosphor Bronze, Au on Ni Plated Contact Barrel: Phosphor Bronze, Au on Ni Plated Spring: Music Wire, Au on Ni Plated Plunger: Beryllium Copper, Gold Plated or Nickel Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.