Electronic Test Probe Pogo Pin Pc50

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Switch Probe Pogo Pin SWP164 for Electronic Test Switching Probes is a kind of functional probes. They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc. Their application field is mainly as below Wire harness connector PCB component detection Door open-close switch Fixture component detection Automation process sensing Position and retention force Below switching probe we will introduce is SWP164. Its diameter is 1.64 mm and total length is 44.65 mm. As usual, switching probes do not entail very high currents, and this model SWP260 can work with the current up to 3 A. The typical maximum contact resistance of this model SWP164 is 160 m. The materials used for the construction of switching probes are different for each component: The barrel is made of brass. Subsequently gold plated during the galvanic plating phase. The spring is made of gold plated music wire. The plunger is made of Beryllium Copper, then gold and nickel plated. The insulating sleeve is made of POM For details of SWP164 switching probe, please check below parameters. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 160 milliohms, maximum Full Stroke: 5 mm Rated Stroke: 3.3 mm Spring Force: 130 gf (4.5 oz) Normal Condition: Disconnecting between Plunge 1 and Plunger 2 Press down 1 mm: Continuity between Plunger 1 and Plunger 2 Materials Contact Barrel: Brass, Au on Ni Plated Spring: SWP, Au on Ni Plated Plunger 1: Beryllium Copper, Au on Ni Plated Plunger 2: Beryllium Copper, Au on Ni Plated Insulating Sleeve: POM Advantages of this switching probe Reliable performance Low cost of test Best yield Our company are also able to change the head shape, total length and diameter, etc., of our switching probes to facilitate their use in different applications. The pitch of installation of switch probes depends on your specific needs. Company Information Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Electronic Test Probe Pogo Pin SCPA055 Series for Integrated Circuit Inspection Semiconductor test probes are usually called double-ended pogo pins. � Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. SCPA055 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. Its parameters are as below. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: Beryllium Copper, Au on Ni Plated Spring: SUS304, Au on Ni Plated Electronic Specification: Current Rating: 3.5 amps Contact Resistance: 100 milliohms max Bandwidth: 9.3 GHz@-1dB Propagation Delay: 25 ps Inductance: 1MHZ@-0.01046uH Captance: 1MHZ@2.42635uF Specifications: Full Stroke: 0.8 mm Rated Stroke: 0.65 mm Spring Force: 25 �±7 gf@load 0.65 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal

Electronic Test Probe Double-sided Spring Pogo Pin SCPA057 for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. SCPA057 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. Its parameters are as below. Materials (plated) Barrel: Ph, Au on Ni Plated Bottom Plunger: BeCu, Au on Ni Plated Top Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 3 Amps Contact Resistance: 100 milliohms, max Bandwidth: 5 GHz at -1dB Propagation Delay: 24 ps Inductance: 1MHZ at -0.03664 uH Captance: 1MHZ at -0.704638 uF Specifications: Full Stroke: 0.63 mm Rated Stroke: 0.5 mm Spring Force: 45 ±13 gf at load 0.5 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

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