Semiconductor Test Probe Spring-Loaded Pogo Pin SCPA031(21) for Chip Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA031(21) we will introduce is 0.31 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 0.7 mm. But it is better to be pressed at a distance of 0.45 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.45 mm, the loaded force is about 20 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.4 GHz at -1dB
Inductive Reactance: 1MHZ at -0.05996 uH
Capacitive Reactance: 1MHZ at 0.425647 uF
Specifications:
Full Stroke: 0.7 mm
Rated Stroke: 0.45 mm
Spring Force: 20 6 gf at load 0.45 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Semiconductor Test Probe Spring-Loaded Pogo Pin SCPA031(21) for Chip Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA031(21) we will introduce is 0.31 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 0.7 mm. But it is better to be pressed at a distance of 0.45 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.45 mm, the loaded force is about 20 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Ph, Au on Ni Plated Bottom Plunger: BeCu, Au on Ni Plated Top Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 2 amps Contact Resistance: 100 milliohms max Bandwidth: 7.4 GHz at -1dB Inductance: 1MHZ at -0.05996 uH Captance: 1MHZ at 0.425647 uF Specifications: Full Stroke: 0.7 mm Rated Stroke: 0.45 mm Spring Force: 20�?�±6 gf at load 0.45 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
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