In-circuit Test Probe Pogo Pin PE75 Series for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PE75 series here. Its test center is 75 mil. The diameter is 1.91 mm and the total length is 33.1 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.91 mm (75 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms
Mounting Hole Size: Diameter 1.35 mm
Full Stroke: 6.4 mm
Rated Stroke: 4.3 mm
Spring Force: 150 gf (5.5 oz)/200 gf (7.2 oz)/227 gf (8 oz)
Materials
Receptacle: Brass, Gold Plated
Contact Barrel: Phosphor Bronze, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: BeCu, Nickel Plated or Gold Plated
semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
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One Touch Ultra Test Strips are for use with the One Touch Ultra and OneTouch UltraSmart Meters for quantitatively measuring glucose in whole blood. Fast test time of 5 seconds. OneTouch Ultra Test Strips are for blood glucose testing with the OneTouch Ultra Family of Meters, and the InDuo Systems. Tiny blood sample (1 microlitre) End-fill strip automatically draws in blood Indicator window shows when you have enough blood Touchable strip Easy-open flip-top vial for use with the One Touch Ultra brand and InDuo meters only.
Gold Plated Pogo Pin PCBA Probe PE75(PO) Series for In-circuit Test In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PE75(PO) series here. Its test center is 75 mil. The diameter is 1 mm and the total length is 33 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.91 mm (75 mil) Current Rating: 3 Amps, continuous Contact Resistance: 40 milliohms Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 155 gf (5.5 oz)/203 gf (7.2 oz)/227 gf (8 oz)/300 gf (10 oz) Materials Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
This recertified Medical MD Oxygen Cylinder is perfect for professional or personal home oxygen use. With a 14.6 cu ft capacity,this medical oxygen cylinder is perfect for portability and smaller spaces. This lightweight, easy to transport aluminum requalified cylinder is DOT approved, and ready for medical or industrial use. It comes fitted with a CGA870 post valve installed and a freshly painted dome in a Medical Green color for easy identification. PREMIUM CONSTRUCTION Reconditioned High-quality aluminum body Clearcoat protected Medical green rust-resistant painted dome CGA870 medical post valve installed Approximately 4.4â?³ in diameter x 16.3â?³ in height* (with valve) Weighs approximately 6 pounds Capacity 14.6 cubic foot 2015 PSI service / 3360 PSI test pressure Stamped DOT-3AL2015 5-year retest interval Recertified test within 180 days prior to shipment
In-circuit Test Probe Pogo Pin P156 Series for PCB Assembly Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQ156 series here. Its test center is 156 mil. The diameter is 2.36 mm and the total length is 33.79 mm. Various tip styles, for example, B, C, G, J, K, L, T, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, WW and WW-L, to fit each test probe For details, please check below parameters. Technical Specifications Recommended Minimum Center: 3.96 mm (156 mil) Current Rating: 5 Amps, continuous Contact Resistance: 50 milliohms Mounting Hole Size: 2.75 mm Full Stroke: 6.35 mm Rated Stroke: 4.32 mm Spring Force: 113/198/255/285 gf (4/7/9/10 oz) Materials Receptacle: Phosphor Bronze, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.