Centalic Technology Development Ltd.

Spring Pin Battery Contact Probe BIP85 Series for Connector Application

Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.

Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.

A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

The products in this page are classified into BIP85 series of battery contact probes. The outside diameter is usually 0.85 mm and there are some common tip styles, for example J.

For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms (Maximum)
Full Stroke: 0.5/1.5 mm
Rated Stroke: 0.34/1 mm
Spring Force: 28/ 48 gf (1/ 1.78 oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper, Gold Plated

radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Printed Circuit Board Assembly Test Probe Pogo Pin PQ75 Series Applied to ICT

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PQ75 series here. Its test center is 75 mil. The diameter is 1.02 mm and the total length is 33.02 mm. Various tip styles, for example, H, K, L, BK, etc., are available for test probes. There are three types of receptacles, namely CR, SC and WW, to fit each test probe.
For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 1.91 mm (75 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms
Mounting Hole Size: Diameter 1.35 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 112/150/198 gf (4/5.5/7 oz)

Materials
Receptacle: Brass, Gold Plated
Contact Barrel: Phosphor Bronze, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper, Nickel Plated or Gold Plated

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Electronic Test Probe Pogo Pin PSICT39 Series for PCBA Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PSICT39 series here. The diameter is 0.61 mm and the total length is 19.5 mm. Various tip styles, for example, B, H, S, T, E, C, U, G, etc., are available for test probes.

For details, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 70 milliohms
Full Stroke: 4 mm
Rated Stroke: 2.5 mm
Spring Force: 70 gf (2.5 oz) at load 2.5 mm

Materials
Receptacle: Brass, Au on Ni Plated
Contact Barrel: Phosphor Bronze, Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated

For more information, please check below catalog.

Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

In-circuit Test Probe Pogo Pin P078 Series for Printed Circuit Board Assembly

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe P078-BK-346 series here. The diameter is 0.78 mm and the total length is 34.6 mm. Various tip styles, for example, BK, H, S, T, E, C, U, G, etc., are available for test probes.


For details, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.9 mm
Rated Stroke: 4.6 mm
Spring Force: 200 gf (7 oz) at load 4.6 mm

Materials
Contact Barrel: Phosphor Bronze, Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Plunger: SK4, Au on Ni Plated

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Interface Probe Test Pin IFP-004 for Transmitting Electrical Signals

Interface probes are functional probes. They are not used for tests and only play a role in connection or control in switching functions, etc. Interface probes are used for transmitting electrical signals from one end to the other end in test fixtures.

Interface probes manufactured by Centalic mainly include the models 001, 002, 003, 004, 005, 006 and 007 in IFP series. This product, IFP-004, is made from phosphor bronze or brass, plated with gold. Characterized by excellent conductivity, it is usually used for the connection of electronic components and functional tests.

IFP-004 interface probe is 17.8 mm in total length. If customers wish to change its length or diameter, we could do as required. Unlike IFP-001, it has a base at the end. If the gold plating is expected to be thicken or thinned, we could try to do according to requirements. Customization is welcome.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Double-sided Spring Pogo Pin Test Probe SCPA021 Series for IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPA021 we will introduce is 0.21 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 200 milliohms.

The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 12 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Ph/ SP, Au on Ni Plated
Bottom Plunger: SK4, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on NI Plated

Electronic Specification:
Current Rating: 1 amp
Contact Resistance: 200 milliohms max
Bandwidth: 9.7 GHz at -1dB
Inductance: 1MHZ at -0.05647 uH
Captance: 1MHZ at 0.864722 uF

Specifications:
Full Stroke: 1.1 mm
Rated Stroke: 0.65 mm
Spring Force: 124 gf at load 0.65 mm
Mechanical Life: about 100000 cycles

semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Semiconductor Test Probe Double-ended Pogo Pin SCPE015 for IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPE015 is the tiniest series in semiconductor test probes since its outside diameter is only 0.15mm. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices   Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

Its parameters are as below.
Materials (plated)
Barrel: Gold Clad, No Plated
X-Bottom (Plunger 1): Pd, No Plated
Y-Top (Plunger 2): Pd, No Plated
Spring: SWP, Au on Ni Plated

Electronic Specification:
Current Rating: 0.5 amp
Contact Resistance: 250 milliohms max
Bandwidth: 11.4 GHz@-1dB
Inductance: 1MHZ@-0.06439uH
Captance: 1MHZ@0.364375uF

Specifications:
Full Stroke: 0.8 mm
Rated Stroke: 0.6 mm
Spring Force: 9 ±2 gf@load 0.6 mm
Mechanical Life: about 100000 cycles

Company Information:
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

High-Current Probe Pogo Pin P350(150) for Electronic Test

Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc.

High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments.

High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P350(150)-H-14G(C) This probe can withstand the current up to 20 Amps. And its typical maximum contact resistance is 50 milliohms.
The materials used for the construction of this high-current test probe are different for each component:
The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase.
The spring is made of gold plated music wire.
The plunger is made of SK4, then gold and nickel plated.
The plunger tip is made of brass, then gold and nickel plated.

For details, please check parameters in below table.
Technical Specifications
Recommended
Current Rating: 20 amps, continuous
Contact Resistance: 50 millohms, max
Full Stroke: 7.5 mm
Rated Stroke: 5 mm
Spring Force: 397 gf at load 5 mm

Company Information:
in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

PCBA Test Probe Pogo Pin P166 Series Applied to ICT

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe P166 series here. Its diameter is 1.66 mm and the total length is 48.4 mm. Various tip styles, for example, B3, H, S, T, E, C, U, G, etc., are available for test probes.

For details, please check below parameters.

Technical Specifications
Recommended
Rated Stroke: 5 mm
Spring Force: 500 gf (11 oz)

Materials
Contact Barrel: Brass, Nickel Plated
Spring: Music Wire, Nickel Plated
Plunger: Steel, Nickel Plated

semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Semiconductor Test Probe Double-ended Pogo Pin SCPA085 for IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPA085 we will introduce is 0.85 mm in barrel diameter and 5.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from stainless steel plated with gold and nickel. This double-ended pogo pin could withstand the current up to 6 amps. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 22 gf or 31 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SUS304, Au on Ni Plated

Electronic Specification:
Current Rating: 6 amps
Contact Resistance: 100 milliohms max
Bandwidth: 12.1 GHz at -1dB
Inductance: 1MHZ at -0.03212 uH
Captance: 1MHZ at 0.792734 uF

Specifications:
Full Stroke: 1.1 mm
Rated Stroke: 0.65 mm
Spring Force: 226 gf at load 0.65 mm, 319 gf at load 0.65 mm
Mechanical Life: about 200000 cycles

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Switch Probe Test Pogo Pin SWP137 Series for Connection

Switching Probes is a kind of functional probes.They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc.

Their application field is mainly as below
Wire harness connector
PCB component detection
Door open-close switch
Fixture component detection
Automation process sensing
Position and retention force

Below switching probe we will introduce is SWP137. Its diameter is 1.37 mm and total length is 30.75 mm.

As usual, switching probes do not entail very high currents, and this model SWP137 can work with the current up to 3 A.
The typical maximum contact resistance of this model SWP137 is 80 m .

The materials used for the construction of switching probes are different for each component:
The barrel  is made of brass. Subsequently nickel  plated during the galvanic plating phase.
probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website  and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Cable Harness Probe Pogo Pin CHZ136(250) for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHZ136(250) harness probe we will introduce here is 1.36 mm in diameter and 33.1 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 6.7 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 213 gf, namely 7.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 3.6 mm
Rated Stroke: 2.4 mm
Spring Force: 113 33 gf (4 oz) at load 2.4 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Battery Contact Probe Test Pogo Pin BIP48 for Connector Application

Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.

Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.

A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

The products in this page are classified into BIP48 series of battery contact probes. The outside diameter is usually 4.8 mm and total length is 6.8 mm. There are some common tip styles, for example J.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 5.95 mm (235 mil)
Current Rating: 5 Amps, continuous
Contact Resistance: 30 milliohms (Maximum)
Full Stroke: 2.15 mm
Rated Stroke: 1.27 mm
Spring Force: 23 gf (0.8 oz)/ 56 gf ( 2 oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Brass, Gold Plated

semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

In-circuit Test Probe Pogo Pin PQ100 Series for PCBA Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PQ100 series here. Its test center is 100 mil. The diameter is 1.36 mm � and the total length is � 33.25 mm. Various tip styles, for example, H, K, L, BK, etc., are available for test probes. There are four types of receptacles, namely CR, SC, SW and WW, to fit each test probe.
For details �  please check below parameters.

Technical Specifications
Recommended
Minimum Center: 2.54 mm (100 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 30 milliohms
Mounting Hole Size: 1.75 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 100/120/156/203/255/284/312 gf (3.5/4/5.5/7.2/9/10/11 oz)

Materials
Receptacle: Brass, Gold Plated
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper, Nickel Plated or Gold Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world

Welcome to browse our website � and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Electronic Test Probe Pogo Pin SCPA055 Series for Integrated Circuit Inspection

Semiconductor test probes are usually called double-ended pogo pins. � Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

SCPA055 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

Its parameters are as below.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SUS304, Au on Ni Plated

Electronic Specification:
Current Rating: 3.5 amps
Contact Resistance: 100 milliohms max
Bandwidth: 9.3 GHz@-1dB
Propagation Delay: 25 ps
Inductance: 1MHZ@-0.01046uH
Captance: 1MHZ@2.42635uF

Specifications:
Full Stroke: 0.8 mm
Rated Stroke: 0.65 mm
Spring Force: 25 �±7 gf@load 0.65 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Single-ended Probe Pogo Pin P125 Series for PCBA Test

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe P125 series here. Its test center is 125 mil. The diameter is 2.02 mm� and the total length is� 33.28 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, WW and WW-L, to fit each test probe.
For details,�  please check below parameters.

Technical Specifications
Recommended
Minimum Center: 3.18 mm (125 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 30 milliohms
Mounting Hole Size: 2.4 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.32 mm
Spring Force: 113/198/255/285 gf (4/7/9/10 oz)

Materials
Receptacle: Phosphor Bronze, Gold Plated
Contact Barrel: Phosphor Bronze, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper, Nickel Plated or Gold Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Spring Probe Pin PQL100 for PCB Assembly Test

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PQL100 series here. Its diameter is 1.36 mm and the total length is 33.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes.

For details, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.65 mm
Rated Stroke: 4.4 mm
Spring Force: 140 gf (5 oz) at load 4.4 mm

Materials
Contact Barrel: Brass, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Plunger: SK4, Au on Ni Plated

manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Double-ended Pogo Pin Test Probe SCPA100 for IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPA100  we will introduce is 1  mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices.   Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

Cable Harness Probe Pogo Pin CH136-LJ7(6.1) for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH136-LJ7(6.1) harness probe we will introduce here is 1.36 mm in diameter and 33.1 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4 mm at most when this probe works, although the plunger can move as far as 6.1 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4 mm, its loaded force is about 225 gf, namely 8 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

For details, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.1 mm
Rated Stroke: 4 mm
Spring Force: 225�±65 gf (8 oz) at load 4 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Cable Harness Probe Pogo Pin CHL165-HQ(8.3) for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHL165-HQ(8.3) harness probe we will introduce here is 1.65 mm in diameter and 35.8 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 100 milliohms. It is suggested the plunger be pressed at a distance of 3.5 mm at most when this probe works, although the plunger can move as far as 5.3 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 3.5 mm, its loaded force is about 113 gf, namely 4 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 100 milliohms
Full Stroke: 5.3 mm
Rated Stroke: 3.5 mm
Spring Force: 113�±35 gf (4 oz) at load 3.5 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

In-circuit Test Probe Pogo Pin PE50 for PCBA Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

Interface Probe Test Pin IFP-001 Used for Transmitting Electrical Signals

Interface probes are functional probes. They are not used for tests and only play a role in connection or control in switching functions, etc. Interface probes are used for transmitting electrical signals from one end to the other end in test fixtures.

Interface probes manufactured by mainly include the models 001, 002, 003, 004, 005, 006 and 007 in IFP series. This product, IFP-001, is made from phosphor bronze or brass, plated with gold. Characterized by excellent conductivity, it is usually used for the connection of electronic components and functional tests.

IFP-001 interface probe is 14.22 mm in total length. If customers wish to change its length or diameter, we could do as required. This probe is unique in shape. It is straight whereas others, for example 002, 003, 004, 005, 006, 007, have an extra base at the end. If the gold plating is expected to be thicken or thinned, we could try to do according to requirements. Customization is welcome.

Company Information
was founded in 1980.  Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Semiconductor Test Probe Pogo Pin SCPB038 for IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCFB038 we will introduce is 0.38 mm in barrel diameter and 6 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.6 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.6 mm, the loaded force is about 25 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Ph, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 1.5 amps
Contact Resistance: 100 milliohms max
Bandwidth: 5.3 GHz at -1dB
Propagation Delay: 27 ps
Inductance: 1MHZ at -0.02809 uH
Captance: 1MHZ at 0.876347 uF

Specifications:
Full Stroke: 1 mm
Rated Stroke: 0.6 mm
Spring Force: 25 7 gf at load 0.6 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Spring Pogo Pin Semiconductor Test Probe SCPC028 Applied to IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPC028 we will introduce is 0.28 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 amps. The typical maximal contact resistance is about 150 milliohms.

The plunger can be pressed at a distance of up to 1.05 mm. But it is better to be pressed at a distance of 0.7 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.7 mm, the loaded force is about 25 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.

Materials (plated)
Barrel: Phosphor Bronze/Gold Clad Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 150 milliohms max
Bandwidth: 8.5 GHz at -1dB
Inductive Reactance: 1MHZ at -0.0788 uH
Capacitive Reactance: 1MHZ at 0.3165 uF

Specifications:
Full Stroke: 1.05 mm
Rated Stroke: 0.7 mm
Spring Force: 25�±7 gf at load 0.7 mm
Mechanical Life: about 100000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Battery Contact Pin Test Probe BIP80 Series for Connector Application

Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.

Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.

A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

The products in this page are classified into BIP80 series of battery contact probes. The outside diameter is usually 0.8 mm and total length is 11 mm. There are some common tip styles, for example J.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms (Maximum)
Full Stroke: 1 mm
Rated Stroke: 0.9 mm
Spring Force: 60 gf (2.4 oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: BeCu, Gold Plated

Battery Contact Probe Test Pogo Pin BIP39 for Connector Application

Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.
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Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.

A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. � The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

The products in this page are classified into BIP39series of battery contact probes. The outside diameter is usually 3.89 mm � and there are some common tip styles, for example � J.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 5.084 mm (200 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms (Maximum)
Full Stroke: 2.6 mm
Rated Stroke: 1.7 mm
Spring Force: 113/ 255 gf (4/ 9 oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Brass, Gold Plated

Company information:
Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Switch Probe Pogo Pin SWP298 Series for Electronic Test

Switching Probes is a kind of functional probes. They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc. 

Their application field is mainly as below
Wire harness connector
PCB component detection
Door open-close switch
Fixture component detection
Automation process sensing
Position and retention force

Harness Probe Pogo Pin CHZ136-H(8.4) for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHZ136 harness probe we will introduce here is 1.36 mm in diameter and 33.4 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of nickel-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.3 mm at most when this probe works, although the plunger can move as far as 6.4 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.3 mm, its loaded force is about 113 gf, namely 4 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating:   3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.4 mm
Rated Stroke: 4.3 mm
Spring Force: 113 ±33 gf (4 oz) @ load 4.3 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Ni Plated
Spring: SW-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.
�?� 
Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

In-circuit Test Probe Pogo Pin PICT75 Series for PCBA Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PICT75� series here. Its� diameter is 1 mm� and the total length is 21 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, CRW� and SW� to fit each test probe.� 
For details, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 150 milliohms
Full Stroke: 4 mm
Rated Stroke: 2.65 mm
Spring Force:�  130 gf (4.5 oz) at load 2.65 mm

Materials
Contact Barrel: Phosphor Bronze, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Interface Probe Straight Brass Pin IFP-002 for Transmitting Electrical Signals

Interface probes are functional probes. They are not used for tests and only play a role in connection or control in switching functions, etc. Interface probes are used for transmitting electrical signals from one end to the other end in test fixtures.

Interface probes manufactured by Centalic mainly include the models 001, 002, 003, 004, 005, 006 and 007 in IFP series. This product, IFP-002, is made from phosphor bronze or brass, plated with gold. Characterized by excellent conductivity, it is usually used for the connection of electronic components and functional tests.

IFP-002 interface probe is 14.3 mm in total length. If customers wish to change its length or diameter, we could do as required. Unlike IFP-001, it has a base at the end. If the gold plating is expected to be thicken or thinned, we could try to do according to requirements. Customization is welcome.

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

In-circuit Test Probe Pogo Pin PE75 Series for PCBA Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PE75 series here. Its test center is 75 mil. The diameter is 1.91 mm and the total length is 33.1 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe.
For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 1.91 mm (75 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms
Mounting Hole Size: Diameter 1.35 mm
Full Stroke: 6.4 mm
Rated Stroke: 4.3 mm
Spring Force: 150 gf (5.5 oz)/200 gf (7.2 oz)/227 gf (8 oz)

Materials
Receptacle: Brass, Gold Plated
Contact Barrel: Phosphor Bronze, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: BeCu, Nickel Plated or Gold Plated

semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Switch Probe Pogo Pin SWP164 for Electronic Test

Switching Probes is a kind of functional probes. They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc.

Their application field is mainly as below
Wire harness connector
PCB component detection
Door open-close switch
Fixture component detection
Automation process sensing
Position and retention force

Below switching probe we will introduce is SWP164. Its diameter is 1.64 mm and total length is 44.65 mm.

As usual, switching probes do not entail very high currents, and this model SWP260 can work with the current up to 3 A.
The typical maximum contact resistance of this model SWP164 is 160 m.

The materials used for the construction of switching probes are different for each component:

The barrel is made of brass. Subsequently gold plated during the galvanic plating phase.

The spring is made of gold plated music wire.

The plunger is made of Beryllium Copper, then gold and nickel plated.
The insulating sleeve is made of POM

For details of SWP164 switching probe, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 160 milliohms, maximum
Full Stroke: 5 mm
Rated Stroke: 3.3 mm
Spring Force: 130 gf (4.5 oz)
Normal Condition: Disconnecting between Plunge 1 and Plunger 2
Press down 1 mm: Continuity between Plunger 1 and Plunger 2

Materials
Contact Barrel: Brass, Au on Ni Plated
Spring: SWP, Au on Ni Plated
Plunger 1: Beryllium Copper, Au on Ni Plated
Plunger 2: Beryllium Copper, Au on Ni Plated
Insulating Sleeve: POM

Advantages of this switching probe
Reliable performance
Low cost of test
Best yield

Our company are also able to change the head shape, total length and diameter, etc., of our switching probes to facilitate their use in different applications. The pitch of installation of switch probes depends on your specific needs.

Company Information
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Double-ended Pogo Pin Test Probe SCPA058 Series for Semiconductor Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

SCPA058 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

Its parameters are as below.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 3.5 Amps
Contact Resistance: 100 milliohms, max
Bandwidth: 8.5 GHz at -1dB
Propagation Delay: 21 ps
Inductive Reactance: 1MHZ at -0.02506 uH
Capacitive Reactance: 1MHZ at -1.01245 uF

Specifications:
Full Stroke: 1.1 mm
Rated Stroke: 0.65 mm
Spring Force: 25�±7 gf at load 0.65 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Wire Harness Probe Spring-loaded Pogo Pin CHZ136-J Series Applied to Electronic Test

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHZ136-J harness probe we will introduce here is 1.36 mm in diameter and 32.8 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 6.9 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 130 gf, namely 4.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.9 mm
Rated Stroke: 4.6 mm
Spring Force: 130�?�±40 gf (4.5 oz) at load 4.6 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Semiconductor Test Probe Spring-Loaded Pogo Pin SCPA031(21) for Chip Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPA031(21) we will introduce is 0.31 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 0.7 mm. But it is better to be pressed at a distance of 0.45 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.45 mm, the loaded force is about 20 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.4 GHz at -1dB
Inductive Reactance: 1MHZ at -0.05996 uH
Capacitive Reactance: 1MHZ at 0.425647 uF

Specifications:
Full Stroke: 0.7 mm
Rated Stroke: 0.45 mm
Spring Force: 20 6 gf at load 0.45 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Semiconductor Test Probe Pogo Pin SCPA030 Series for IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPA030 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 10 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Ph/ SP, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.1 GHz at -1dB
Inductance: 1MHZ at -0.02524 uH
Captance: 1MHZ at 1.12735 uF

Specifications:
Full Stroke: 1.1 mm
Rated Stroke: 0.65 mm
Spring Force: 10 ±3 gf at load 0.65 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

In-circuit Test Probe Pogo Pin P085 Series for PCBA Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe P085 series here. Its diameter is 0.82 mm and the total length is 37 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes.

For details, please check below parameters.

Technical Specifications
Recommended
Rated Stroke: 2 mm
Spring Force: 130 gf (5oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: BeCu, Gold Plated

For more information, please check below catalog.

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Double-Sided Spring Pogo Pin Test Probe SCPC031 Applied to Chip Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPC031 we will introduce is 0.31 mm in barrel diameter and 6.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 150 milliohms.

The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 25 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 1.5 amps
Contact Resistance: 150 milliohms max
Bandwidth: 7.5 GHz at -1dB
Inductance: 1MHZ at -0.05856 uH
Captance: 1MHZ at 0.434274 uF

Specifications:
Full Stroke: 1 mm
Rated Stroke: 0.65 mm
Spring Force: 25�±5 gf at load 0.65 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Pogo Pin Semiconductor Test Probe SCPA101 for IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPA085 we will introduce is 1.01 mm in barrel diameter and 12.8 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This double-ended pogo pin could withstand the current up to 3 amps. The typical maximal contact resistance is about 120 milliohms.

The plunger can be pressed at a distance of up to 2 mm. But it is better to be pressed at a distance of 1.3 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 1.3 mm, the loaded force is about 20 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 3 amps
Contact Resistance: 120 milliohms max
Bandwidth: 11.7 GHz at -1dB
Inductive Reactance: 1MHZ at -0.02219 uH
Capacitive Reactance: 1MHZ at 1.04567 uF

Specifications:
Full Stroke: 2 mm
Rated Stroke: 1.3 mm
Spring Force: 20�±4 gf at load 1.3 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Cable Harness Probe Pogo Pin CHL165-J6(8.5) for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHL165-J6(8.5) harness probe we will introduce here is 1.65 mm in diameter and 36 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 100 milliohms. It is suggested the plunger be pressed at a distance of 5.5 mm at most when this probe works, although the plunger can move as far as 8.5 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 5.5 mm, its loaded force is about 142 gf, namely 5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

For details, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 100 milliohms
Full Stroke: 8.5 mm
Rated Stroke: 5.5 mm
Spring Force: 142�±45 gf (5 oz) at load 5.5 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Double-sided Spring Pogo Pin Test Probe SCPA030 Series Applied to IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPA030 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from stainless steel plated with gold and nickel. This probe pin could withstand the current up to 1.5 Amps. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 2 mm. But it is better to be pressed at a distance of 0.85 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.85 mm, the loaded force is about 10 gf or 20 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: SK4, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SUS304, Au on Ni Plated

Electronic Specification:
Current Rating: 1.5 amps
Contact Resistance: 100 milliohms max
Bandwidth: 9.3 GHz at -1dB
Inductance: 1MHZ at -0.02829 uH
Captance: 1MHZ at -0.609436 uF

Specifications:
Full Stroke: 2 mm
Rated Stroke: 0.85 mm
Spring Force: 10�± 3 gf at load 0.85 mm, 20�± 6 gf at load 0.85 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Electronic Test Probe Double-sided Spring Pogo Pin SCPA057 for IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

SCPA057 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

Its parameters are as below.
Materials (plated)
Barrel: Ph, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 3 Amps
Contact Resistance: 100 milliohms, max
Bandwidth: 5 GHz at -1dB
Propagation Delay: 24 ps
Inductance: 1MHZ at -0.03664 uH
Captance: 1MHZ at -0.704638 uF

Specifications:
Full Stroke: 0.63 mm
Rated Stroke: 0.5 mm
Spring Force: 45 ±13 gf at load 0.5 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

High-Current Probe Pogo Pin P420 Series for Electronic Test

Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc.

High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments.

High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P420-HP-19G(C). This probe can withstand the current up to 20 Amps. And its typical maximum contact resistance is 20 milliohms.
The materials used for the construction of this high-current test probe are different for each component:
our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Gold Plated Switch Probe Test Pogo Pin SWP260 Series for Connection

Switching Probes is a kind of functional probes. They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc.

Their application field is mainly as below
Wire harness connector
PCB component detection
Door open-close switch
Fixture component detection
Automation process sensing
Position and retention force

Below switching probe we will introduce i

As usual, switching probes do not entail very high currents, and this model SWP260 can work with the current up to 3 A. SWP260  is 50 m

The materials used for the construction of switching probes are different for each component:

Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website  and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Electronic Test Probe Pogo Pin PC50 Series for PCBA Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PC50 series here. Its test center is 50 mil, namely 1.27 mm. The diameter is 0.78 mm and the total length is 43.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, SW and CRW, to fit each test probe.
For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 60 milliohms
Mounting Hole Size: 1 mm
Full Stroke: 6.4 mm
Rated Stroke: 4.3 mm
Spring Force: 100/110/150/200 gf (3.6/4/5.4/7.2 oz)

Materials
Receptacle: Phosphor Bronze, Gold Plated
Contact Barrel: Phosphor Bronze, Gold Plated
Spring:�  Music Wire, Gold Plated
Plunger: SK4, Nickel Plated or Gold Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Battery Contact Pogo Pin Test Probe BIP16 Series for Connector Application

Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.

Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.

A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative.� The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

The products in this page are classified into BIP16 series of battery contact probes. The outside diameter is usually 1.6 mm and there are some common tip styles, for example J.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 2.54 mm (100 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms (Maximum)
Full Stroke: 2.5 mm
Rated Stroke: 1.8 mm
Spring Force: 95 gf (3.4 oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring:�  Music Wire, Gold Plated
Plunger: BeCu, Gold Plated

Company information:
Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Interface Probe Test Pin IFP-007 for Transmitting Electrical Signals

Interface probes are functional probes. They are not used for tests and only play a role in connection or control in switching functions, etc. Interface probes are used for transmitting electrical signals from one end to the other end in test fixtures.

Interface probes manufactured by Centalic mainly include the models 001, 002, 003, 004, 005, 006 and 007 in IFP series. This product, IFP-007, is made from phosphor bronze or brass, plated with gold. Characterized by excellent conductivity, it is usually used for the connection of electronic components and functional tests.

IFP-007 interface probe is 40.05 mm in total length. If customers wish to change its length or diameter, we could do as required. Unlike IFP-001, it has a base at the end. If the gold plating is expected to be thicken or thinned, we could try to do according to requirements. Customization is welcome.

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

In-circuit Test Probe Pogo Pin P156 Series for PCB Assembly Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PQ156 series here. Its test center is 156 mil. The diameter is 2.36 mm and the total length is 33.79 mm. Various tip styles, for example, B, C, G, J, K, L, T, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, WW and WW-L, to fit each test probe
For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 3.96 mm (156 mil)
Current Rating: 5 Amps, continuous
Contact Resistance: 50 milliohms
Mounting Hole Size: 2.75 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.32 mm
Spring Force: 113/198/255/285 gf (4/7/9/10 oz)

Materials
Receptacle: Phosphor Bronze, Gold Plated
Contact Barrel: Phosphor Bronze, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper, Nickel Plated or Gold Plated

Company Information
Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Double-Ended Pogo Pin Test Probe SCFB029(40) for Chip Inspection

Semiconductor test probes are usually called double-ended pogo pins � Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

SCPB029(40) is unique in shape among semiconductor test probes due to a convex ring at one end of its barrel. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. �  Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production � 

Its parameters are as below.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on NI Plated

Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 8.5 GHz@-1dB
Inductance: 1MHZ@-0.02661uH
Captance: 1MHZ@0.925374uF

Specifications:
Full Stroke: 1 mm
Rated Stroke: 0.65 mm
Spring Force: 14 �±4 gf@load 0.65 mm
Mechanical Life: about 100000 cycles

Company Information:
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Frequency Test Probe Pogo Pin SCPC078 for Chip Inspection

Semiconductor test probes are usually called double-ended pogo pins. � Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

SCPC078 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. There is a concave ring at one end of the barrel. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

Its parameters are as below.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on NI Plated

Electronic Specification:
Current Rating: 4 amps
Contact Resistance: 80 milliohms max
Bandwidth: 9.3 GHz@-1dB
Propagation Delay: 37 ps
Inductance: 1MHZ@-0.01167uH
Captance: 1MHZ@2.16734uF

Specifications:
Full Stroke: 1.8 mm
Rated Stroke: 0.8 mm
Spring Force: 30 �±9 gf@load 0.8 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Radio Frequency Probe Pogo Pin RPM700 Series for Electronic Test

Radio frequency coaxial probes are a type of measurement device used for electronic test equipment to measure radio frequency signals of electronic circuits in silicon wafers, die and open microchips. In addition, RF coaxial probes are used in narrow pitch or high density RF interconnect applications in connector assemblies. Transmission lines used in RF applications are usually coaxial cables connected to circuit boards and microstrip lines inside circuit boards.

Features:
Low impedance
High bandwidth
Repeatable measurements
Coaxial design
Interchangeable inner pin

Advantages
Low cost
Best yield
Repeatable accurate test
Long lifespan

Application
Broadband RF measurements
PCBA test
SMA connectors
RF switches
etc.

There is a fixed schedule for mass production of radio frequency test probe RPM700 we will introduce here. This probe is 33.55 mm in total length  This probe can withstand the current up to 1 Amp.

The materials used for the construction of this radio frequency test probe are different for each componen  are plated during the galvanic plating phase.
The spring  is  made of gold-plated music wire.


For details, please check parameters in below table.
Materials (plated)
Barrel (1): Brass, Au on Ni Plated
Plunger (1): Brass, Au on Ni Plated
Barrel (2): Phosphor Bronze, Au on Ni Plated
Plunger (2): Beryllium Copper, Au on Ni Plated

POM
Spring: SWP-A/B, Au on Ni Plated

Specifications
Full Stroke: 3.5 mm
Rated Stroke: 2.3 mm
Spring Force: 388 gf at load 2.3 mm

Company Information:
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Cable Harness Probe Pogo Pin CH136 for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33  mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 1.67  mm at most when this probe works, although the plunger can move as far as 2.5  mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 1.67 mm, its loaded force is about 140  gf, namely 5  ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 2.5 mm
Rated Stroke: 1.67 mm
Spring Force: 140 ±40 gf (5 oz) at   load 1.67 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Electronic Test Probe Double-ended Pogo Pin SCPE025 Series for IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPE025 we will introduce is 0.25 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 0.5 Amp. The typical maximal contact resistance is about 250 milliohms.

The plunger can be pressed at a distance of up to 1.9 mm. But it is better to be pressed at a distance of 1.25 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 1.25 mm, the loaded force is about 12 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze/ Gold Clad Phosphor Bronze, Au on Ni Plated
X: Bottom (Plunger 1): SK4, Au on Ni Plated
Y: Top (Plunger 2): SK4, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 0.5 amp
Contact Resistance: 250 milliohms max
Bandwidth: 10.8 GHz at -1dB
Inductive Reactance: 1MHZ at -0.07234 uH
Capacitive Reactance: 1MHZ at 0.329458 uF

Specifications:
Full Stroke: 1.9 mm
Rated Stroke: 1.25 mm
Spring Force: 12 �±4 gf at load 1.25 mm
Mechanical Life: about 100000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Wire Harness Probe Pogo Pin CHL165 for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHL165 harness probe we will introduce here is 1.65 mm in diameter and 35.4 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 100 milliohms. It is suggested the plunger be pressed at a distance of 3.5 mm at most when this probe works, although the plunger can move as far as 5.3 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 3.5 mm, its loaded force is about 113 gf, namely 4 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 100 milliohms
Full Stroke: 5.3 mm
Rated Stroke: 3.5 mm
Spring Force: 113�?�±35 gf (4 oz) at load 3.5 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Cable Harness Probe Pogo Pin CHL265 for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHL265 harness probe we will introduce here is 2.65 mm in diameter and 28.4 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 100 milliohms. It is suggested the plunger be pressed at a distance of 3.5 mm at most when this probe works, although the plunger can move as far as 5.5 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 3.5 mm, its loaded force is about 113 gf, namely 4 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 100 milliohms
Full Stroke: 5.5 mm
Rated Stroke: 3.5 mm
Spring Force: 113�?�±35 gf (4 oz) at load 3.5 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Interface Probe Straight Metal Pin IFP-003 for Transmitting Electrical Signals

Interface probes are functional probes. They are not used for tests and only play a role in connection or control in switching functions, etc. Interface probes are used for transmitting electrical signals from one end to the other end in test fixtures.

Interface probes manufactured by Centalic mainly include the models 001, 002, 003, 004, 005, 006 and 007 in IFP series. This product, IFP-003, is made from phosphor bronze or brass, plated with gold. Characterized by excellent conductivity, it is usually used for the connection of electronic components and functional tests.

IFP-003 interface probe is 16.33 mm in total length. If customers wish to change its length or diameter, we could do as required. Unlike IFP-001, it has a base at the end. If the gold plating is expected to be thicken or thinned, we could try to do according to requirements. Customization is welcome.

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

High-Current Probe Pogo Pin P203 for Electronic Test

Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc.

High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments.

High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P203. This probe can withstand the current up to 17 Amps. And its typical maximum contact resistance is 80 milliohms.

The materials used for the construction of this high-current test probe are different for each component:
The barrel is made of phosphor bronze. Subsequently gold and nickel plated during the galvanic plating phase.
The spring is made of gold plated music wire.
The plunger is made of beryllium copper, then gold and nickel plated.

For details, please check parameters in below table.
Technical Specifications
Recommended
Current Rating: 17 amps, continuous
Contact Resistance: 80 milliohms, max
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 115 gf (4 oz) at load 4.3 mm

Company Information:
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Double-sided Spring Pogo Pin Test Probe SCPC058 for IC Test

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPC058 we will introduce is 0.58 mm in barrel diameter and 8.85 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from SUS304 plated with gold and nickel. This double-sided spring pogo pin could withstand the current up to 4 amps. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 1.2 mm. But it is better to be pressed at a distance of 0.8 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.8 mm, the loaded force is about 35 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.

Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SUS304, Au on Ni Plated

Electronic Specification:
Current Rating: 4 amps
Contact Resistance: 100 milliohms max
Bandwidth: 9.3 GHz at -1dB
Inductance: 1MHZ at -0.02158 uH
Captance: 1MHZ at 1.4027 uF

Specifications:
Full Stroke: 1.2 mm
Rated Stroke: 0.8 mm
Spring Force: 35�±7 gf at load 0.8 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Semiconductor Test Probe Spring-Loaded Pogo Pin SCPA031(21) for Chip Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPA031(21) we will introduce is 0.31 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 0.7 mm. But it is better to be pressed at a distance of 0.45 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.45 mm, the loaded force is about 20 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Ph, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.4 GHz at -1dB
Inductance: 1MHZ at -0.05996 uH
Captance: 1MHZ at 0.425647 uF

Specifications:
Full Stroke: 0.7 mm
Rated Stroke: 0.45 mm
Spring Force: 20�?�±6 gf at load 0.45 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Battery Contact Probe Test Pogo Pin BIP148 Series for Connector Application

Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.

Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.

A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

The products in this page are classified into BIP148 series of battery contact probes. The outside diameter is usually 1.49 mm and there are some common tip styles, for example J.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 2.16 mm (85 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms (Maximum)
Full Stroke: 2 mm
Rated Stroke: 1.33 mm
Spring Force: 25 gf (1/ 0.9 oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: BeCu, Gold Plated

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Semiconductor Test Probe Pogo Pin SCPC035 Series for IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPC035 we will introduce is 0.35 mm in barrel diameter and 7.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2.5 amps. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.5 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.5 mm, the loaded force is about 18 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)

Barrel Phosphor Bronze, Au on Ni Plated
Bottom Plunger Beryllium Copper, Au on Ni Plated
Top Plunger Beryllium Copper, Au on Ni Plated
Spring SWP-A/B, Au on Ni Plated

Electronic Specification:

Current Rating 2.5 amps
Contact Resistance 100 milliohms max
Bandwidth 5.8 GHz at -1dB
Inductance 1MHZ at -0.01039 uH
Captance 1MHZ at 2.35287 uF

Specifications:

Full Stroke 1 mm
Rated Stroke 0.5 mm
Spring Force 18 �±5 gf at load 0.5 mm
Mechanical Life about 200000 cycles


Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

PCBA Assembly Test Probe Pogo Pin PQL50 Series Applied to ICT

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PQL50 series here. Its diameter is 0.78 mm and the total length is 43.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles to fit the probes, for instance, CR, SW, CRW and WW.

The plunger can be pressed at a distance of up to 6.35 mm. But it is better to be pressed at a distance of 4.3 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 4.3 mm, the loaded force is about 5.5 oz, 7 oz or 8 oz, which fluctuates to a tolerance.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 60 milliohms
Mounting Hole Size: Diameter 1 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 150 gf (5.5 oz)/ 185 gf (7 oz)/ (227 gf (8 oz)

Materials
Receptacle: Phosphor Bronze, Gold Plated
Contact Barrel: Phosphor Bronze, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper, Nickel Plated or Gold Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

High-current Probe Pogo Pin P264 Series for Electronic Test

Product Description
Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness big-current probes, etc.

Big-current probes are characterized by high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current.

Big-current probes manufactured by Centalic mainly include P203 ( OD of barrel is 2.03 mm. The below is same), P228, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P264-HP-7G(B).

The total length of P264-HP-7G(B) is 28.45 mm and outside diameter is 2.64 mm. This probe can withstand up to 24 amps and its typical maximum contact resistance is 50 milliohms. This probe is comprised of a barrel, a plunger and a spring, all of which are plated with gold and nickel.

For details, please check below parameters:
Technical Specifications:
Current rating: 24 amps, continuous
Contact resistance: 50 milliohms
Full stroke: 5.3 mm
Rated stroke: 3.5 mm
Spring force: 200gf (7 oz) @ load 3.5 mm

Materials (plated):
Contact Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company information:
Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.


Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Test Probe Pogo Pin PL50 Series for PCBA Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PL50 series here. Its test center is 50 mil, namely 1.27 mm. The diameter is 0.68 mm and the total length is 27.53 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles, namely CR, VCR, SC, VSC, CRW and VCRW, to fit each test probe.
For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Mounting Hole Size: Diameter 0.95 mm
Full Stroke: 3.7 mm
Rated Stroke: 2.54 mm
Spring Force: 28/56/85 gf (1/2/3 oz)

Materials
Receptacle: Brass, Gold Plated
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper/SK4, Nickel Plated or Gold Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Spring Loaded Pogo Pin Test Probe BIP68 Series for Battery Contact

Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.

Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.

A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

The products in this page are classified into BIP68 series of battery contact probes. The outside diameter is usually 0.68 mm and there are some common tip styles, for example J.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 0.95 mm (37 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms (Maximum)
Full Stroke: 0.5 mm
Rated Stroke: 0.4 mm
Spring Force: 10 gf (0.35 oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: BeCu, Gold Plated

Company information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Wire Harness Probe Pogo Pin CH203 Series for Electronic Test

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH203 harness probe we will introduce here is 2.03 mm in diameter and 35.9 mm in total length. Its barrel is made of phosphor bronze plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of stainless steel plated with gold and nickel.

This probe can withstand up to the current 5 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 5 mm at most when this probe works, although the plunger can move as far as 7.75 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 5 mm, its loaded force is about 145 gf, namely 5.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 5 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 7.75 mm
Rated Stroke: 5 mm
Spring Force: 145 ±43 gf (5.5 oz) at load 5 mm

Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SUS, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Cable Harness Contact Probe Pin CHL137 for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHL137 harness probe we will introduce here is 1.37 mm in diameter and 26.7 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 100 milliohms. It is suggested the plunger be pressed at a distance of 2.8 mm at most when this probe works, although the plunger can move as far as 4.2 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 2.8 mm, its loaded force is about 100 gf, namely 3.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 100 milliohms
Full Stroke: 4.2 mm
Rated Stroke: 2.8 mm
Spring Force: 100 ±30 gf (3.5 oz) at load 2.8 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Harness Probe Pogo Pin CH136 Series for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 2.67�?� mm at most when this probe works, although the plunger can move as far as 4�?� mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 2.67�?� mm, its loaded force is about 185�?� gf, namely 6.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications

Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 4 mm
Rated Stroke: 2.67 mm
Spring Force: 185 ±55 gf (6.5 oz) at   load 2.67 mm
Materials (plated)

Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.
�?� 
Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Test Probe Pogo Pin SCPA020 for Integrated Circuit Inspection

Semiconductor test probes are usually called double-ended pogo pins.  Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPA020 we will introduce is 0.2 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. �  Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottome plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from SUS304 plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 200 milliohms

The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.6 mm at most in working environments. Otherwise the spring will probably be damaged severely under constanct pressure. When the plunger is pressed at a distance of 0.6 mm, the loaded force is about 12 gf, which fluctuates to a tolerane.

For details, please check parameters in below table.
Materials (plated)

Barrel: Ph/ SP, Au on Ni Plated
Bottom Plunger: SK4, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP   Au on Ni Plated

Electronic Specification:

Current Rating: 1 amp
Contact Resistance: 200 milliohms max
Bandwidth: 9.3 GHz at -1dB
Inductance: 1MHZ at -0.13527uH
Captance: 1MHZ  at 0.186437uF

Specifications:

Full Stroke: 1.1 mm
Rated Stroke: 0.6 mm
Spring Force: 12 ±4 gf at load 0.6 mm
Mechanical Life: about 100000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Welcome to browse our website centalic.com and download any catalogs of our products.

Pogo Pin Test Probe BIP47 Series for Battery Contact

Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.

Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.

A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

The products in this page are classified into BIP47 series of battery contact probes. The outside diameter is usually 1.6 mm and there are some common tip styles, for example J.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 2.54 mm (100 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 20 milliohms (Maximum)
Full Stroke: 1.5 mm
Rated Stroke: 1.5 mm
Spring Force: 80 gf (2.8 oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: BeCu, Gold Plated

Company information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

High-current Probe Pogo Pin P265 Series for Electronic Test

Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc.

High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments.

High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P265. This probe can withstand the current up to 24 Amps. And its typical maximum contact resistance is 50 milliohms.

The materials used for the construction of this high-current test probe are different for each component:
The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase.
The spring is made of gold plated stainless steel.
The plunger is made of beryllium copper, then gold and nickel plated.

For details, please check parameters in below table.
Technical Specifications
Recommended
Current Rating: 24 amps, continuous
Contact Resistance: 50 milliohms, max
Full Stroke: 5.3 mm
Rated Stroke: 3.5 mm
Spring Force: 220 gf (7 oz) at load 3.5 mm

Company Information:
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Cable Harness Probe Pogo Pin CH136-J for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 5.3 mm at most when this probe works, although the plunger can move as far as 8 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 5.3 mm, its loaded force is about 57 gf, namely 2 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 8 mm
Rated Stroke: 5.3 mm
Spring Force: 57±17 gf (2 oz) at load 5.3 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Pogo Pin High-current Probe P350(300) Series for Electronic Test

Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc.

High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments.

High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P350(300). This probe can withstand the current up to 24 Amps. And its typical maximum contact resistance is 70 milliohms.

The materials used for the construction of this high-current test probe are different for each component:
The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase.
The spring is made of gold plated music wire.
The plunger is made of beryllium copper, then gold and nickel plated.

For details, please check parameters in below table.
Technical Specifications
Recommended
Current Rating: 24 amps, continuous
Contact Resistance: 70 milliohms, max
Full Stroke: 5.5mm
Rated Stroke: 3.6 mm
Spring Force: 340 gf at load 3.6 mm

Company Information:

Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Interface Pin Test Probe IFP-005 for Transmitting Electrical Signals

Interface probes are functional probes. They are not used for tests and only play a role in connection or control in switching functions, etc. Interface probes are used for transmitting electrical signals from one end to the other end in test fixtures.

Interface probes manufactured by Centalic mainly include the models 001, 002, 003, 004, 005, 006 and 007 in IFP series. This product, IFP-005, is made from phosphor bronze or brass, plated with gold. Characterized by excellent conductivity, it is usually used for the connection of electronic components and functional tests.

IFP-005 interface probe is 17.8 mm in total length. If customers wish to change its length or diameter, we could do as required. Unlike IFP-001, it has a base at the end. If the gold plating is expected to be thicken or thinned, we could try to do according to requirements. Customization is welcome.

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Semiconductor Test Probe Pogo Pin SCFE035 for Integrated Circuit Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCFE035 we will introduce is 0.35 mm in barrel diameter and 18 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 150 milliohms.

The plunger can be pressed at a distance of up to 1.5 mm. But it is better to be pressed at a distance of 1 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 1 mm, the loaded force is about 38 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Ph, Au on Ni Plated
Bottom Plunger: SK4, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 1.5 amps
Contact Resistance: 150 milliohms max
Bandwidth: 9.3 GHz at -1dB
Inductance: 1MHZ at -0.05517 uH
Captance: 1MHZ at 0.462432 uF

Specifications:
Full Stroke: 1.5 mm
Rated Stroke: 1 mm
Spring Force: 38�?�±11 gf at load 1 mm
Mechanical Life: about 200000 cycles

For more information, please check below catalog.

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Cable Harness Probe Pogo Pin CHZ199 Series for Electronic Test

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHZ199 harness probe we will introduce here is 1.99 mm in diameter and 33.2 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.4 mm at most when this probe works, although the plunger can move as far as 6.6 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.4 mm, its loaded force is about 133 gf, namely 4.7 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.6 mm
Rated Stroke: 4.4 mm
Spring Force: 133�?�±40 gf (4.7 oz) at load 4.4 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

For more information, please check below catalog.

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Single-headed Pogo Pin Test Probe PQ50 Series for PCBA Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PQ50 series here. Its diameter is 0.78 mm and the total length is 34.6 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 60 milliohms
Mounting Hole Size: Diameter 1 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 85 gf (3 oz) /122 gf (4 oz)/ 150 gf (5.5 oz) at load 4.3 mm

Materials
Receptacle: Phosphor Bronze, Au on Ni Plated
Contact Barrel: Phosphor Bronze, Au on Ni Plated
Spring: Music Wire, Au on Ni Plated
Plunger: Beryllium Copper, Gold Plated or Nickel Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

PCBA Test Probe Pogo Pin PL75 Series Applied to ICT

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PL75 series here. Its test center is 75 mil. The diameter is 1.02 mm and the total length is 27.83 mm. Various tip styles, for example, H, K, L, BK, etc., are available for test probes. There are roughly six types of receptacles, namely CR, VCR, SC, VSC, WW and VWW to fit each test probe.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 1.91 mm (75 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Mounting Hole Size: Diameter 1.35 mm
Full Stroke: 4 mm
Rated Stroke: 2.54 mm
Spring Force: 113 gf (4 oz)

Materials
Receptacle: Brass, Gold Plated
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper/SK4, Nickel Plated or Gold Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Spring-loaded Pogo Pin In-circuit Test Probe PICT102-BK(7.6) for PCBA Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PICT102-BK(7.6) series here. Its barrel diameter is 1.02 mm and the total length is 33 mm.

The barrel of this pogo pin is made from phosphor bronze plated with gold and nickel. The plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This test probe could withstand the current up to 3 Amps. The typical maximal contact resistance is about 50 milliohms.

The plunger can be pressed at a distance of up to 6.8 mm. But it is better to be pressed at a distance of 4.3 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 4.3 mm, the loaded force is about 205 gf, which fluctuates to a tolerance.

For details, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.8 mm
Rated Stroke: 4.3 mm
Spring Force: 205 gf (7 oz) at load 4.3 mm

Materials
Contact Barrel: Phosphor Bronze, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Plunger: SK4, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Wire Harness Probe Pogo Pin CHD136 for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of the automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHD136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 7 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 255 gf, namely 9 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 7 mm
Rated Stroke: 4.6 mm
Spring Force: 255�±75 gf (9 oz) at load 4.6 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Spring Pogo Pin Battery Contact Test Probe BIP94 for Connector Application

Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.

Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.

A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

The products in this page are classified into BIP94 series of battery contact probes. The outside diameter is usually 0.94 mm and there are some common tip styles, for example J.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms (Maximum)
Full Stroke: 0.78 mm
Rated Stroke: 0.7 mm
Spring Force: 30 gf (1.05 oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: BeCu/SK4, Gold Plated

Company information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Cable Harness Probe Pogo Pin CH200-H(14) for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH200 harness probe we will introduce here is 1.99 mm in diameter and 39 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.5 mm at most when this probe works, although the plunger can move as far as 7.3 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.5 mm, its loaded force is about 312 gf, namely 11 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 7.3 mm
Rated Stroke: 4.5 mm
Spring Force: 312�?�±65 gf (11 oz) at load 4.5 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Pogo Pin Test Probe BIP114 Series for Battery Contact

Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.

Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.

A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

The products in this page are classified into BIP114 series of battery contact probes. The outside diameter is usually 1.14 mm and there are some common tip styles, for example round head or pointed head.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 1.91 mm (75 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms (Maximum)
Full Stroke: 1.14 mm
Rated Stroke: 1.14 mm
Spring Force: 110 gf (4 oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: BeCu, Gold Plated

Company information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Pogo Pin Semiconductor Test Probe SCPA025 Series for IC Test

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPA025 we will introduce is 0.25 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 14 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.

Materials (plated)
Barrel�¯�¼? Ph/SP, Au on Ni Plated
Bottom Plunger�¯�¼? BeCu, Au on Ni Plated
Top Plunger BeCu, Au on Ni Plated
Spring SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating 1 amp
Contact Resistance 100 milliohms max
Bandwidth ? 9.3 GHz at -1dB
Inductance 1MHZ at -0.02384 uH
Captance 1MHZ at 1.06747 uF

Specifications:
Full Stroke 1.1 mm
Rated Stroke 0.65 mm
Spring Force 4 gf at load 0.65 mm
Mechanical Life about 100000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Gold-plated Probe Pogo Pin PE100(90) Series for In-circuit Test

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PE100(90) series here. Its test center is 100 mil. The diameter is 1.36 mm and the total length is 34 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 2.54 mm (100 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 30 milliohms
Mounting Hole Size: Diameter 1.75 mm
Full Stroke: 6.5 mm
Rated Stroke: 4.3 mm
Spring Force: 284 gf (10 oz)

Materials
Receptacle: Brass, Gold Plated
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper, Nickel Plated or Gold Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Gold Plated Pogo Pin PCBA Probe PE75(PO) Series for In-circuit Test

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PE75(PO) series here. Its test center is 75 mil. The diameter is 1 mm and the total length is 33 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 1.91 mm (75 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 155 gf (5.5 oz)/203 gf (7.2 oz)/227 gf (8 oz)/300 gf (10 oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper, Nickel Plated or Gold Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Electronic Test Probe Double-ended Pogo Pin SCPC030(50)-XX-67 for IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPC030(50)-XX-67 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.8 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.8 mm, the loaded force is about 12 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Ph, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 1.5 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.5 GHz at -1dB
Inductance: 1MHZ at -0.05032 uH
Captance: 1MHZ at 0.502464 uF

Specifications:
Full Stroke: 1 mm
Rated Stroke: 0.8 mm
Spring Force: 12�?�±3 gf at load 0.8 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

In-circuit Test Probe Spring-loaded Pogo Pin PE100(115) for PCBA Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PE100(115) series here. Its test center is 100 mil. The diameter is 1.36 mm and the total length is 36.5 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 2.54 mm (100 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 30 milliohms
Mounting Hole Size: Diameter 1.75 mm
Full Stroke: 6.5 mm
Rated Stroke: 4.3 mm
Spring Force: 200 gf (7.2 oz)/255 gf (9 oz)/284 gf (10 oz)

Materials
Receptacle: Brass, Gold Plated
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper, Nickel Plated or Gold Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.