In-circuit Test Probe Pogo Pin PICT75 Series for PCBA Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PICT75� series here. Its� diameter is 1 mm� and the total length is 21 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, CRW� and SW� to fit each test probe.� 
For details, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 150 milliohms
Full Stroke: 4 mm
Rated Stroke: 2.65 mm
Spring Force:�  130 gf (4.5 oz) at load 2.65 mm

Materials
Contact Barrel: Phosphor Bronze, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.