Electronic Test Probe Pogo Pin SCPA055 Series for Integrated Circuit Inspection
Semiconductor test probes are usually called double-ended pogo pins. � Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
SCPA055 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
Its parameters are as below.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SUS304, Au on Ni Plated
Electronic Specification:
Current Rating: 3.5 amps
Contact Resistance: 100 milliohms max
Bandwidth: 9.3 GHz@-1dB
Propagation Delay: 25 ps
Inductance: 1MHZ@-0.01046uH
Captance: 1MHZ@2.42635uF
Specifications:
Full Stroke: 0.8 mm
Rated Stroke: 0.65 mm
Spring Force: 25 �±7 gf@load 0.65 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
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