BRUKER S1 TITAN HANDHELD XRF SPECTROMETER
The S1 TITAN is among the lightest (1.5 kg, including battery) tube-based handheld XRF analyzers on the market today. Fast analysis speed and exceptional accuracy are two key attributes that help define the S1 TITAN.
Other innovative features include an integrated touch-screen color display, 50 kV X-ray tube, SMART GradeTM timing, SharpBeamTM optimized X-ray geometry, Silicon Drift Detector (SDD), and an extremely tough housing that is sealed against humid and dusty environments. Contact our sales team today to learn more about the innovative S1 TITAN!
The S1 TITAN series is available in four (4) configurations: models 800, 600, 500 and 200. All models use Brukerâ??s SharpBeamTM technology. The S1 TITAN 800 and 600 use a FAST SDD detector to give you incredibly fast analysis times. The S1 TITAN 500 is configured with a fast, accurate, and affordable standard SDD detector. The S1 TITAN 200 is configured with an economical Si-PIN detector. In addition, the S1 TITAN can be configured with calibrations that are optimized for a variety of sample materials- including a wide range of alloys, various mining & environmental samples, as well as restricted materials.
SharpBeamTM technology
The S1 TITANs patent pending SharpBeamTM technology optimizes the detector and tube geometry. The optimized geometry has many desirable effects, including:
Reduces power requirements
Reduces weight
Improves measurement precision
Improved detection limits
Increases battery life
S1 TITAN Technical Details
NEW! pXRF Specification comparison (PDF)
Calibration range (depending on specific calibration):
S1 TITAN 800: 37 elements, including light elements Mg, Al & Si
S1 TITAN 600: 37 elements, including light elements Mg, Al & Si
S1 TITAN 500: 32 elements
S1 TITAN 200: 32 elements
Weight: 1.5 kg (3.3 lbs) with battery
Size: 25 cm x 28 cm x 9 cm (10 in x 11 in x 3.7 in)
Sample temperature:
S1 TITAN 800: Default to 150 C with Ultralen window. Up to 500C with Kapto window and hot surface adapter.
S1 TITAN 600: Default to 150 C with Ultralene window. Up to 500C with Kapton window and hot surface adapter.
S1 TITAN 500: up to 500C
S1 TITAN 200: up to 500C
TITAN Detector ShieldTM:
Included on all S1 TITAN models
Integrated camera:
S1 TITAN 800: Included
S1 TITAN 600: Optional
S1 TITAN 500: Not available
S1 TITAN 200: Not available
Detector:
S1 TITAN 800: FAST SDD�®
S1 TITAN 600: FAST SDD�®
S1 TITAN 500: Standard SDD
S1 TITAN 200: Si-PIN
Collimator options:
S1 TITAN 800: 5mm standard. Optional 8mm or 3mm
S1 TITAN 600: 5mm
S1 TITAN 500: 5mm
S1 TITAN 200: 5mm
X-ray tube: Rh target; max voltage 50 kV
Filter changer:
S1 TITAN 800: Five position motorized filter changer
S1 TITAN 600: Five position motorized filter changer
S1 TITAN 500: Fixed filter
S1 TITAN 200: Fixed filter
Benefits
Environmental studies can now save time and money with real-time, on-the spot elemental analysis - from Magnesium to Uranium,
From PPM to 100 % - in solids, liquids, powders, cores, fragments, filters and films, slurries and more. Portable XRF provides cost-effective, timely analysis.
Innov-X combined an x-ray tube source, multiple beam filtering and the HP PDA to deliver superior limits of detection, speed, precision and upgrade capability.
Features
Superior performance of Cr and other metals. Light element Analysis Program (LEAP) analyzes P, S, Cl, K and Ca
Utilizes advanced and universal XRF data modeling:
Compton Normalization: "Internal Standard" provides for quantitative analysis without site-specific calibrations
Fundamental Parameters: Standardless, ideal for samples with high and low concentration of several elements
Empirical Calibrations: "Calibration Curves" allows user-generated calibration curves
Add new elements and calibrations easily. Innov-X analyzers will meet your requirements today and in the future
View spectra on screen
Compare spectra for comparative analysis and display results versus standards
Stored tests can be re-run with new parameters or models
Data security: stores in binary format for data intel
Description
The Innov-X Omega X-Ray fluorescence spectrometer is a handheld XRF analyser. With its ultra rugged design, diverse field analysis is possible in any conditions.
The XRF delivers fast and precise identification and analysis of elements from phosphorus to uranium (P to U).
Advantages of Field Portable XRF.
In the past, studies relied exclusively on expensive and time consuming analysis based on samples that hopefully characterised the site. The portable XRF has revolutionised environmental investigations by allowing you on-the-spot elemental analysis, in real time. Measure the composition of soils, debris,
run-off streams, dust wipes, coatings, corings, paints, plastic and wood instantly,saving you time and money. From phosphorus to lead,
from low ppm to 100% - in soils, solids, liquids, powders, cores, fragments, filters & films, slurries and more. One simple test can analyse up to 25 separate elements in seconds, including priority pollutants. Determine zonal and contamination patterns; track pollutant migration caused by extreme weather; perform real-time surveys to delineate and define metals present.
In-situ soil analysis for rapid, comprehensive site investigations:
Delineate metals present and contamination patterns
Measure high volume field tests to minimise laboratory analytical costs
Test soil directly through plastic corings or bagged samples
Establish contamination boundaries and depth profiles for remediation and disposal
Collection of samples to produce rock-solid analytical data at the site:
XRF is non-destructive submit same sample for laboratory confirmation
Ensure validation requirements/targets are met on-site in real time
Prepared soil sample testing assures the maximum possible accuracy
Ultimate XRF Performance with
Silicon Drift Detector (SDD) Technology
The Innov-X Omega Xpress and Omega Xpress Vacuum
Alloy Analyzers utilize the latest in detector technology - an innovative, large area Silicon Drift Detector (SDD), commonly used and tested extensively in high end, laboratory based instrumentation. In comparison to a traditional
Si PiN Diode detector, the SDD provides:
10x improvement in signal to background ratio
Marked resolution improvement, from 195eV to 165eV
The capacity to handle 10x more counts
Key benefts to the user:
>3x improvement in reading speed.
Light element (Mg, Al, Si, P, S) analysis in air
3x better limits of detection for sensitive tramp elements
