Interface Pin Test Probe Ifp 005 Suppliers and Manufacturers

Product name : Medal/Lapel pin/Coin Material : zinc alloy / brass / Copper / stainless steel / bronze / iron / aluminum / tin / gold / silver Deisgn : 2D/3D,one side logo or double. Shape : square/rectangle/roundness etc.(customized) Craftwork die casting / stamping / carve / printing / welding / plating / painting. Color : printing / enamel / laser / anodize / plating / injection etc. Size: Any size & customer size. Plating options: gold, antique gold, silver, and antique silver, antique bronze ,nickel, anti-nickel, black nickel, brass, anti-brass, copper, anti-copper, dyed black Accessory: safety pin , butterfly pin , Sticker, Magnet. etc Usage: promotional gifts/souvenirs/decoration / wedding gifts /birthday gifts etc. OEM: Customized logos and Designs are welcomed Certiflcate: Business License,BV certiflcate,SGS,TÃ?V SÃ?D certiflcate and CE test report Delivery way: EXW,FOB,CIF,etc Shipping: FedEx / DHL / UPS / TNT / EMS etc. Payment: T/T ,Western Union ,Paypal ,L/C .

Product name : Badge/medal/coin Material : zinc alloy brass Copper stainless steel bronze iron aluminum tin gold silver Deisgn : 2D 3D,one side logo or double. Shape : square rectangle roundness etc.(customized) Craftwork die casting stamping carve printing welding plating painting. Color : printing enamel laser anodize plating injection etc. Size: Any size & customer size. Plating options: gold, antique gold, silver, and antique silver, antique bronze ,nickel, anti-nickel, black nickel, brass, anti-brass, copper, anti-copper, dyed black Accessory: safety pin , butterfly pin , Sticker, Magnet. etc Usage: promotional gifts souvenirs decoration wedding gifts birthday gifts etc. OEM: Customized logos and Designs are welcomed Certiflcate: Business License,BV certiflcate,SGS,TÃ?V SÃ?D certiflcate and CE test report Delivery way: EXW,FOB,CIF,etc Shipping: FedEx DHL UPS TNT EMS etc. Payment: T T ,Western Union ,Paypal ,L C .

We are specialized in providing Copper Fasteners to customers. The Copper Fasteners are manufactured using high-grade copper. Our experts check the Copper Fasteners on various parameters to assure their flawlessness. The Copper Fasteners can be customized to meet the requirements of the clients. Specifications: Form: rivet, stud bolts, hex head bolts, anchor bolts, u-bolts, j bolts, mushroom head square neck bolts, t head bolts, eye bolt, foundation bolts, structural bolts, Hexagon nuts, hexagon coupling nuts, square nut, self locking nut , hexagon domed cap nuts, plain washer , plain big od washer , plain small od washer , spring lock washer , spring washer, heavy duty washer, socket head allen cap screws, threaded rod (stud), split pin, etc. Range: M10 to M100 and length from 15 mm to 5 Mtrs long Test Certificate: MTC, TC from government approved Laboratory under Third Party Inspection

Global distributor: covid 19 igm/igg rapid test, covid 19 real time pcr assay, alk break apart fish probe kit, and warfarin genotyping assay.Global distributor

High Performance Spring pin f14x80 M01225.OBMCC1D1.5A Dada Dhuniwale power The use of advanced technology, absolutely first-class service quality, is our constant faith over the years. Production is in strict accordance with national standard, line standard and technical standards. The main technical backbone are retired senior engineer and senior technicians, who has participated in the design, manufacture and installation of Gezhouba, Ertan, Three Gorges and other power plants. We have served hundreds of hydropower stations, thermal power plant overhaul, and technical transformation to provide high quality equipment, construction design, installation, spare parts, and after-sales service. Yoyik can offer many spare parts for power plants as below: #DF-Spring pin f14x80 M01225.OBMCC1D1.5A-DF Bolt heating rod (hose) ZDKL=430D=240�?15 valve coil MFJ1-3 O-shaped sealing ring HQ01.267 Reduction gearbox M01225.OBGCC1D1.5A differential pressure valve diaphragm 19C1964001 Pressure relief valve AW20-NO2H-CZ pressure hose SMS-20-915mm-B Accumulator gas charging and measuring tool LNXQ-AB-80/10 FY stainless steel Throttle valve (welded) J61Y-320 DN50 VALVE POPPET IK525 O-ring rubber seal 45*4-G-S-GB/T3452.1 Threaded joint SS-PHN-NS4-MS20 Pressure measuring joint CSHD-G1/4" KIT CHARGING NITROGEN FOR ACCUMULATOR NXQ10L solenoid operated valve 8YV ac evacuation pump P-1741 Coupling HSNH280-50A-005 vacuum pump working principle N-625 MOOG sealing components MOD-072-559A Accumulator bladder NXQA-B-40/31.5-L-K accumulator bladder suppliers NXQ A10/31.5-L-EH quick stop valve K25FJ-1.6P Machinery Seal DFB100-80-250 Solenoid valve 9333CH98V4BC5-KCX125\3/8" AST solenoid valve HQ16.A-0.01Z solenoid 22FDA-F5T-W220R-20 CV actuator piston rod oil sealing ring HB4-56J8-164 O-ring HY-SO-0074-V IPSV actuator unloading valvesealing set DRV30-1-10/2 sealing ring AH06180310 servo valve controller SFD-21-DSV-001 The electromagnetic valve G-110VDC-DN6-UK High-pressure pipeline 16G2AT-HMP(DN32)*500SFS90 11/4-DN32/SFL-11/2-DN32/SS water ring vacuum pump working 6"Lg magnetic gear box M01225 pressure hose SMS-12/20-1524mm-C Spring pin f14x80 M01225.OBMCC1D1.5A

Pogo pin, test probe, test pin, semiconductor test probe, in circuit test probe, switch probe, interface probe, battery contact probe, big current probe, harness probe, radio frequency probe.

The COVID-19 RT-PCR Detection Kit is a real-time RT-PCR test intended for the qualitative detection of nucleic acid from the SARS-CoV-2 in upper and lower respiratory specimens (such as anterior nasal swabs, mid-turbinate nasal swabs, nasopharyngeal swabs, oropharyngeal swabs, sputum, lower respiratory tract aspirates, bronchoalveolar lavage, and nasopharyngeal wash/aspirate or nasal aspirate) from individuals suspected of COVID-19 by their healthcare provider. Testing is limited to laboratories certified under the Clinical Laboratory Improvement Amendments (CLIA) of 1988, 42 U.S.C. 263a, to perform high complexity tests. Results are for the identification of SARS-CoV-2 RNA. The SARS-CoV-2 RNA is generally detectable in upper and lower respiratory specimens during the acute phase of infection. Positive results are indicative of the presence of SARS-CoV-2 RNA; clinical correlation with patient history and other diagnostic information is necessary to determine patient infective status. The agent detected may not be the definite cause of disease. Positive results do not rule out bacterial co-infection with other viruses. Laboratories within the United States and its territories are required to report all positive results to the appropriate public health authorities. Negative results do not preclude SARS-CoV-2 infection and should not be used as the sole basis for patient management decisions. Negative results must be combined with clinical observations, patient history, and epidemiological information. The COVID-19 RT-PCR Detection Kit is intended for use by qualified trained clinical laboratory personnel specifically instructed and trained in the techniques of real-time PCR and in vitro diagnostic procedures. The COVID-19 RT-PCR Detection Kit is only for use under the Food and Drug Administration's Emergency Use Authorization. PRINCIPLE OF DETECTION This product is a fluorescent probe-based Taqman RT-PCR assay system. Firstly, the RNA of SARS-CoV-2 will be reverse transcribed into cDNA by reverse transcriptase, and then PCR amplification will be performed with cDNA as template. During amplification of the template, the TaqMan probe will be degraded due to the 5'-3 polymerase activity and exonuclease activity of Taq DNA polymerase, then the separation of fluorescent reporter and quencher enables the fluorescent signal to be detected by instrument. The ORF1ab gene of SARS-CoV-2 will be detected qualitatively by FAM channel, the N gene of SARS-CoV-2 will be detected qualitatively by JOE channel, the E gene of SARS-CoV-2 will be detected qualitatively by ROX channel, and the internal reference will be detected by CY5 channel. dUTP and UNG enzyme are used in the kit to prevent contamination of the amplified products. Internal reference is used in the kit for quality control starting from sample collection

Test probe Movable and wall-or ceiling-hung electric room heaters - ul 1278 Figure 8.3 articulate probe with web stop The low size 1000(pcs)

Switch Probe Pogo Pin SWP164 for Electronic Test Switching Probes is a kind of functional probes. They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc. Their application field is mainly as below Wire harness connector PCB component detection Door open-close switch Fixture component detection Automation process sensing Position and retention force Below switching probe we will introduce is SWP164. Its diameter is 1.64 mm and total length is 44.65 mm. As usual, switching probes do not entail very high currents, and this model SWP260 can work with the current up to 3 A. The typical maximum contact resistance of this model SWP164 is 160 m. The materials used for the construction of switching probes are different for each component: The barrel is made of brass. Subsequently gold plated during the galvanic plating phase. The spring is made of gold plated music wire. The plunger is made of Beryllium Copper, then gold and nickel plated. The insulating sleeve is made of POM For details of SWP164 switching probe, please check below parameters. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 160 milliohms, maximum Full Stroke: 5 mm Rated Stroke: 3.3 mm Spring Force: 130 gf (4.5 oz) Normal Condition: Disconnecting between Plunge 1 and Plunger 2 Press down 1 mm: Continuity between Plunger 1 and Plunger 2 Materials Contact Barrel: Brass, Au on Ni Plated Spring: SWP, Au on Ni Plated Plunger 1: Beryllium Copper, Au on Ni Plated Plunger 2: Beryllium Copper, Au on Ni Plated Insulating Sleeve: POM Advantages of this switching probe Reliable performance Low cost of test Best yield Our company are also able to change the head shape, total length and diameter, etc., of our switching probes to facilitate their use in different applications. The pitch of installation of switch probes depends on your specific needs. Company Information Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Test Probe Pogo Pin PL50 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PL50 series here. Its test center is 50 mil, namely 1.27 mm. The diameter is 0.68 mm and the total length is 27.53 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles, namely CR, VCR, SC, VSC, CRW and VCRW, to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Mounting Hole Size: Diameter 0.95 mm Full Stroke: 3.7 mm Rated Stroke: 2.54 mm Spring Force: 28/56/85 gf (1/2/3 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper/SK4, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Spring Probe Pin PQL100 for PCB Assembly Test In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQL100 series here. Its diameter is 1.36 mm and the total length is 33.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 6.65 mm Rated Stroke: 4.4 mm Spring Force: 140 gf (5 oz) at load 4.4 mm Materials Contact Barrel: Brass, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Plunger: SK4, Au on Ni Plated manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world. Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal

Semiconductor Test Probe Pogo Pin SCPC035 Series for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPC035 we will introduce is 0.35 mm in barrel diameter and 7.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2.5 amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.5 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.5 mm, the loaded force is about 18 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel Phosphor Bronze, Au on Ni Plated Bottom Plunger Beryllium Copper, Au on Ni Plated Top Plunger Beryllium Copper, Au on Ni Plated Spring SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating 2.5 amps Contact Resistance 100 milliohms max Bandwidth 5.8 GHz at -1dB Inductance 1MHZ at -0.01039 uH Captance 1MHZ at 2.35287 uF Specifications: Full Stroke 1 mm Rated Stroke 0.5 mm Spring Force 18 �±5 gf at load 0.5 mm Mechanical Life about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

PCBA Test Probe Pogo Pin P166 Series Applied to ICT In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe P166 series here. Its diameter is 1.66 mm and the total length is 48.4 mm. Various tip styles, for example, B3, H, S, T, E, C, U, G, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Rated Stroke: 5 mm Spring Force: 500 gf (11 oz) Materials Contact Barrel: Brass, Nickel Plated Spring: Music Wire, Nickel Plated Plunger: Steel, Nickel Plated semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Semiconductor Test Probe Double-ended Pogo Pin SCPA085 for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA085 we will introduce is 0.85 mm in barrel diameter and 5.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from stainless steel plated with gold and nickel. This double-ended pogo pin could withstand the current up to 6 amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 22 gf or 31 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: Beryllium Copper, Au on Ni Plated Spring: SUS304, Au on Ni Plated Electronic Specification: Current Rating: 6 amps Contact Resistance: 100 milliohms max Bandwidth: 12.1 GHz at -1dB Inductance: 1MHZ at -0.03212 uH Captance: 1MHZ at 0.792734 uF Specifications: Full Stroke: 1.1 mm Rated Stroke: 0.65 mm Spring Force: 226 gf at load 0.65 mm, 319 gf at load 0.65 mm Mechanical Life: about 200000 cycles Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

In-circuit Test Probe Pogo Pin P156 Series for PCB Assembly Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQ156 series here. Its test center is 156 mil. The diameter is 2.36 mm and the total length is 33.79 mm. Various tip styles, for example, B, C, G, J, K, L, T, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, WW and WW-L, to fit each test probe For details, please check below parameters. Technical Specifications Recommended Minimum Center: 3.96 mm (156 mil) Current Rating: 5 Amps, continuous Contact Resistance: 50 milliohms Mounting Hole Size: 2.75 mm Full Stroke: 6.35 mm Rated Stroke: 4.32 mm Spring Force: 113/198/255/285 gf (4/7/9/10 oz) Materials Receptacle: Phosphor Bronze, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Electronic Test Probe Pogo Pin PC50 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PC50 series here. Its test center is 50 mil, namely 1.27 mm. The diameter is 0.78 mm and the total length is 43.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, SW and CRW, to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 60 milliohms Mounting Hole Size: 1 mm Full Stroke: 6.4 mm Rated Stroke: 4.3 mm Spring Force: 100/110/150/200 gf (3.6/4/5.4/7.2 oz) Materials Receptacle: Phosphor Bronze, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring:�  Music Wire, Gold Plated Plunger: SK4, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Printed Circuit Board Assembly Test Probe Pogo Pin PQ75 Series Applied to ICT In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQ75 series here. Its test center is 75 mil. The diameter is 1.02 mm and the total length is 33.02 mm. Various tip styles, for example, H, K, L, BK, etc., are available for test probes. There are three types of receptacles, namely CR, SC and WW, to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.91 mm (75 mil) Current Rating: 3 Amps, continuous Contact Resistance: 40 milliohms Mounting Hole Size: Diameter 1.35 mm Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 112/150/198 gf (4/5.5/7 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Wire Harness Probe Pogo Pin CHD136 for the Tests of Automotive Industry Harness probes are mainly used directly or for the tests of the automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CHD136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel. This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 7 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 255 gf, namely 9 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 7 mm Rated Stroke: 4.6 mm Spring Force: 255�±75 gf (9 oz) at load 4.6 mm Materials (plated) Barrel: Brass, Au on Ni Plated Plunger: Beryllium Copper, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.