Test Probe

Semiconductor Test Probe Double-ended Pogo Pin SCPA085 for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA085 we will introduce is 0.85 mm in barrel diameter and 5.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from stainless steel plated with gold and nickel. This double-ended pogo pin could withstand the current up to 6 amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 22 gf or 31 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: Beryllium Copper, Au on Ni Plated Spring: SUS304, Au on Ni Plated Electronic Specification: Current Rating: 6 amps Contact Resistance: 100 milliohms max Bandwidth: 12.1 GHz at -1dB Inductance: 1MHZ at -0.03212 uH Captance: 1MHZ at 0.792734 uF Specifications: Full Stroke: 1.1 mm Rated Stroke: 0.65 mm Spring Force: 226 gf at load 0.65 mm, 319 gf at load 0.65 mm Mechanical Life: about 200000 cycles Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Supplier: Pogo pin, test probe, test pin, semiconductor test probe, in circuit test probe, switch probe, interface probe, battery contact probe, big current probe, harness probe, radio frequency probe

Supplier: Terminal block, connector, network and communication products, test probe, cables

Supplier: Standard contacts, semiconductor test probes, in circuit test/functional probes high current test probes, threaded/ screw in probes, interface pins, battery probe pins high frequency, coaxial cables, cable assemblies, dc blocks, rf adaptors rf coaxial connectors, rf test probes, sockets/ modules, semiconductor test sockets pogo/ probe blocks, coaxial modules
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Probe card - For IC,TFT-LCD cell testing

Latest smart-fit GJ3C TV LED backlight tester current voltage 0-320V adjustable laptop lamp light detection repair tool. Multipurpose GJ3C LED TV lamp backlight tester with high and low current gear, for LED backlight and components detection. Features: 1. It's used for inspection and repair of any size TV LED backlight without disassembling the LED. 2. Capacitance withstand voltage can be tested, test range: 0-200v. 3. It can test the voltage regulation value of the Zener diode, test range: 0-200v. 4. The voltage value of the lamp bead board can be tested to determine the quality of the lamp bead. 5. High and low current gear, the output voltage is 0-320V, a new low current gear is added for component detection, when the positive and negative LEDs are not confirmed, the low current gear can be used to test the positive and negative (safer), and then use the high current gear to detect. 6. Safe, smart, accurate, efficient. Specification: Input voltage: AC85-265V. Output voltage: DC0-320V Output current: 30mA (for TV testing). Output current: 1mA (for small components). Usage: 1. Please disconnect the power of the detected object first.(If you use it to test TV backlight,you should make sure the LCD screen is powered on.) 2. Plug in power, it can be used after 5 to 10 seconds to reach 320V. The soft start mode makes the backlight get brighter slowly. 3. Suggest using 1mA except the TV backlight testing. 4. Don't connect the probes to the LED for a long time if you can't determine the 5. Don't touch the output terminal of probes for a long time .It's safe to touch the probes in short time periods. Package list: 1 x LED LCD TV Backlight Tester. 2 x Table pen. 1 x User guide.