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High-Current Probe Pogo Pin P350(150) for Electronic Test
Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc.
High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments.
High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P350(150)-H-14G(C) This probe can withstand the current up to 20 Amps. And its typical maximum contact resistance is 50 milliohms.
The materials used for the construction of this high-current test probe are different for each component:
The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase.
The spring is made of gold plated music wire.
The plunger is made of SK4, then gold and nickel plated.
The plunger tip is made of brass, then gold and nickel plated.
For details, please check parameters in below table.
Technical Specifications
Recommended
Current Rating: 20 amps, continuous
Contact Resistance: 50 millohms, max
Full Stroke: 7.5 mm
Rated Stroke: 5 mm
Spring Force: 397 gf at load 5 mm
Company Information:
in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Double-sided Spring Pogo Pin Test Probe SCPA021 Series for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA021 we will introduce is 0.21 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 200 milliohms.
The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 12 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Ph/ SP, Au on Ni Plated
Bottom Plunger: SK4, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on NI Plated
Electronic Specification:
Current Rating: 1 amp
Contact Resistance: 200 milliohms max
Bandwidth: 9.7 GHz at -1dB
Inductance: 1MHZ at -0.05647 uH
Captance: 1MHZ at 0.864722 uF
Specifications:
Full Stroke: 1.1 mm
Rated Stroke: 0.65 mm
Spring Force: 124 gf at load 0.65 mm
Mechanical Life: about 100000 cycles
semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Welcome to wholesale high quality Semiconductor Refrigeration Technology Training Device at competitive price from professional Semiconductor Refrigeration Technology Training Device manufacturers and suppliers in China. Contact our factory for quotation and pricelist. We...
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