Interface Probe Straight Metal Pin IFP-003 for Transmitting Electrical Signals Interface probes are functional probes. They are not used for tests and only play a role in connection or control in switching functions, etc. Interface probes are used for transmitting electrical signals from one end to the other end in test fixtures. Interface probes manufactured by Centalic mainly include the models 001, 002, 003, 004, 005, 006 and 007 in IFP series. This product, IFP-003, is made from phosphor bronze or brass, plated with gold. Characterized by excellent conductivity, it is usually used for the connection of electronic components and functional tests. IFP-003 interface probe is 16.33 mm in total length. If customers wish to change its length or diameter, we could do as required. Unlike IFP-001, it has a base at the end. If the gold plating is expected to be thicken or thinned, we could try to do according to requirements. Customization is welcome. Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Welcome to browse our website and download any catalogs of our products. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal
Interface Pin Test Probe IFP-005 for Transmitting Electrical Signals Interface probes are functional probes. They are not used for tests and only play a role in connection or control in switching functions, etc. Interface probes are used for transmitting electrical signals from one end to the other end in test fixtures. Interface probes manufactured by Centalic mainly include the models 001, 002, 003, 004, 005, 006 and 007 in IFP series. This product, IFP-005, is made from phosphor bronze or brass, plated with gold. Characterized by excellent conductivity, it is usually used for the connection of electronic components and functional tests. IFP-005 interface probe is 17.8 mm in total length. If customers wish to change its length or diameter, we could do as required. Unlike IFP-001, it has a base at the end. If the gold plating is expected to be thicken or thinned, we could try to do according to requirements. Customization is welcome. Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Welcome to browse our website and download any catalogs of our products. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal
Semiconductor Test Probe Pogo Pin SCFE035 for Integrated Circuit Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCFE035 we will introduce is 0.35 mm in barrel diameter and 18 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 150 milliohms. The plunger can be pressed at a distance of up to 1.5 mm. But it is better to be pressed at a distance of 1 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 1 mm, the loaded force is about 38 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Ph, Au on Ni Plated Bottom Plunger: SK4, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 1.5 amps Contact Resistance: 150 milliohms max Bandwidth: 9.3 GHz at -1dB Inductance: 1MHZ at -0.05517 uH Captance: 1MHZ at 0.462432 uF Specifications: Full Stroke: 1.5 mm Rated Stroke: 1 mm Spring Force: 38�?�±11 gf at load 1 mm Mechanical Life: about 200000 cycles For more information, please check below catalog. Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Cable Harness Probe Pogo Pin CHZ199 Series for Electronic Test Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CHZ199 harness probe we will introduce here is 1.99 mm in diameter and 33.2 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel. This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.4 mm at most when this probe works, although the plunger can move as far as 6.6 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.4 mm, its loaded force is about 133 gf, namely 4.7 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 6.6 mm Rated Stroke: 4.4 mm Spring Force: 133�?�±40 gf (4.7 oz) at load 4.4 mm Materials (plated) Barrel: Brass, Au on Ni Plated Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated For more information, please check below catalog. Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Cable Harness Probe Pogo Pin CH136-J for the Tests of Automotive Industry Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel. This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 5.3 mm at most when this probe works, although the plunger can move as far as 8 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 5.3 mm, its loaded force is about 57 gf, namely 2 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 8 mm Rated Stroke: 5.3 mm Spring Force: 57±17 gf (2 oz) at load 5.3 mm Materials (plated) Barrel: Brass, Au on Ni Plated Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Semiconductor Test Probe Pogo Pin SCPA030 Series for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA030 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 10 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Ph/ SP, Au on Ni Plated Bottom Plunger: BeCu, Au on Ni Plated Top Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 2 amps Contact Resistance: 100 milliohms max Bandwidth: 7.1 GHz at -1dB Inductance: 1MHZ at -0.02524 uH Captance: 1MHZ at 1.12735 uF Specifications: Full Stroke: 1.1 mm Rated Stroke: 0.65 mm Spring Force: 10 ±3 gf at load 0.65 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Spring Pogo Pin Battery Contact Test Probe BIP94 for Connector Application Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components. Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders. A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity. The products in this page are classified into BIP94 series of battery contact probes. The outside diameter is usually 0.94 mm and there are some common tip styles, for example J. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 40 milliohms (Maximum) Full Stroke: 0.78 mm Rated Stroke: 0.7 mm Spring Force: 30 gf (1.05 oz) Materials Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: BeCu/SK4, Gold Plated Company information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Battery Contact Probe Test Pogo Pin BIP148 Series for Connector Application Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components. Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders. A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity. The products in this page are classified into BIP148 series of battery contact probes. The outside diameter is usually 1.49 mm and there are some common tip styles, for example J. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 2.16 mm (85 mil) Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms (Maximum) Full Stroke: 2 mm Rated Stroke: 1.33 mm Spring Force: 25 gf (1/ 0.9 oz) Materials Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: BeCu, Gold Plated Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
In-circuit Test Probe Pogo Pin P085 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe P085 series here. Its diameter is 0.82 mm and the total length is 37 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Rated Stroke: 2 mm Spring Force: 130 gf (5oz) Materials Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: BeCu, Gold Plated For more information, please check below catalog. Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Cable Harness Probe Pogo Pin CH200-H(14) for the Tests of Automotive Industry Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CH200 harness probe we will introduce here is 1.99 mm in diameter and 39 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel. This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.5 mm at most when this probe works, although the plunger can move as far as 7.3 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.5 mm, its loaded force is about 312 gf, namely 11 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 7.3 mm Rated Stroke: 4.5 mm Spring Force: 312�?�±65 gf (11 oz) at load 4.5 mm Materials (plated) Barrel: Brass, Au on Ni Plated Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
PCBA Assembly Test Probe Pogo Pin PQL50 Series Applied to ICT In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQL50 series here. Its diameter is 0.78 mm and the total length is 43.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles to fit the probes, for instance, CR, SW, CRW and WW. The plunger can be pressed at a distance of up to 6.35 mm. But it is better to be pressed at a distance of 4.3 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 4.3 mm, the loaded force is about 5.5 oz, 7 oz or 8 oz, which fluctuates to a tolerance. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 60 milliohms Mounting Hole Size: Diameter 1 mm Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 150 gf (5.5 oz)/ 185 gf (7 oz)/ (227 gf (8 oz) Materials Receptacle: Phosphor Bronze, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Pogo Pin Test Probe BIP114 Series for Battery Contact Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components. Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders. A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity. The products in this page are classified into BIP114 series of battery contact probes. The outside diameter is usually 1.14 mm and there are some common tip styles, for example round head or pointed head. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.91 mm (75 mil) Current Rating: 3 Amps, continuous Contact Resistance: 40 milliohms (Maximum) Full Stroke: 1.14 mm Rated Stroke: 1.14 mm Spring Force: 110 gf (4 oz) Materials Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: BeCu, Gold Plated Company information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Wire Harness Probe Spring-loaded Pogo Pin CHZ136-J Series Applied to Electronic Test Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CHZ136-J harness probe we will introduce here is 1.36 mm in diameter and 32.8 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel. This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 6.9 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 130 gf, namely 4.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 6.9 mm Rated Stroke: 4.6 mm Spring Force: 130�?�±40 gf (4.5 oz) at load 4.6 mm Materials (plated) Barrel: Brass, Au on Ni Plated Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Pogo Pin Semiconductor Test Probe SCPA025 Series for IC Test Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA025 we will introduce is 0.25 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 14 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel�¯�¼? Ph/SP, Au on Ni Plated Bottom Plunger�¯�¼? BeCu, Au on Ni Plated Top Plunger BeCu, Au on Ni Plated Spring SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating 1 amp Contact Resistance 100 milliohms max Bandwidth ? 9.3 GHz at -1dB Inductance 1MHZ at -0.02384 uH Captance 1MHZ at 1.06747 uF Specifications: Full Stroke 1.1 mm Rated Stroke 0.65 mm Spring Force 4 gf at load 0.65 mm Mechanical Life about 100000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Electronic Test Probe Double-ended Pogo Pin SCPC030(50)-XX-67 for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPC030(50)-XX-67 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.8 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.8 mm, the loaded force is about 12 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Ph, Au on Ni Plated Bottom Plunger: BeCu, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 1.5 amps Contact Resistance: 100 milliohms max Bandwidth: 7.5 GHz at -1dB Inductance: 1MHZ at -0.05032 uH Captance: 1MHZ at 0.502464 uF Specifications: Full Stroke: 1 mm Rated Stroke: 0.8 mm Spring Force: 12�?�±3 gf at load 0.8 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Test Probe Pogo Pin SCPA020 for Integrated Circuit Inspection Semiconductor test probes are usually called double-ended pogo pins.  Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA020 we will introduce is 0.2 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. � Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottome plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from SUS304 plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 200 milliohms The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.6 mm at most in working environments. Otherwise the spring will probably be damaged severely under constanct pressure. When the plunger is pressed at a distance of 0.6 mm, the loaded force is about 12 gf, which fluctuates to a tolerane. For details, please check parameters in below table. Materials (plated) Barrel: Ph/ SP, Au on Ni Plated Bottom Plunger: SK4, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP  Au on Ni Plated Electronic Specification: Current Rating: 1 amp Contact Resistance: 200 milliohms max Bandwidth: 9.3 GHz at -1dB Inductance: 1MHZ at -0.13527uH Captance: 1MHZ at 0.186437uF Specifications: Full Stroke: 1.1 mm Rated Stroke: 0.6 mm Spring Force: 12 ±4 gf at load 0.6 mm Mechanical Life: about 100000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. Welcome to browse our website centalic.com and download any catalogs of our products.
Electronic Test Probe Double-sided Spring Pogo Pin SCPA057 for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. SCPA057 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. Its parameters are as below. Materials (plated) Barrel: Ph, Au on Ni Plated Bottom Plunger: BeCu, Au on Ni Plated Top Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 3 Amps Contact Resistance: 100 milliohms, max Bandwidth: 5 GHz at -1dB Propagation Delay: 24 ps Inductance: 1MHZ at -0.03664 uH Captance: 1MHZ at -0.704638 uF Specifications: Full Stroke: 0.63 mm Rated Stroke: 0.5 mm Spring Force: 45 ±13 gf at load 0.5 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Application OB/GYN Abdomen scan Superficial parts Urology Ophthalmic scan MSK Nerve block Feature Integrated clipboard, display the saved image at the bottom of the screen, which can be directly called or deleted Preset optimized image inspection conditions for different inspection organs, reducing adjustment procedures during operation Abdomen, uterine attachment, heart, fetus, urinary system, prostate, blood vessels, small organs, newborn, musculoskeletal, intraoperative scan Complete Probe Family,� probe box silicone lining, effective protection of probe Subarray Technology Harmonic Imaging Technology (THI) CE certified
Certificate: CE, FDA, CMDCAS Screen: LCD or TFT Working frequency: 2.5 MHz or 3.0 MHz Measuring mode: Manual Calculating mode, Average mode, Transient mode
Application: Abdomen, obstetrics, gynecology, heart, urinary system, small organs, superficial, blood vessels, pediatrics, newborns, musculoskeletal
