Semiconductor Test Probe Double-ended Pogo Pin SCPE015 for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPE015 is the tiniest series in semiconductor test probes since its outside diameter is only 0.15mm. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices  Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
Its parameters are as below.
Materials (plated)
Barrel: Gold Clad, No Plated
X-Bottom (Plunger 1): Pd, No Plated
Y-Top (Plunger 2): Pd, No Plated
Spring: SWP, Au on Ni Plated
Electronic Specification:
Current Rating: 0.5 amp
Contact Resistance: 250 milliohms max
Bandwidth: 11.4 GHz@-1dB
Inductance: 1MHZ@-0.06439uH
Captance: 1MHZ@0.364375uF
Specifications:
Full Stroke: 0.8 mm
Rated Stroke: 0.6 mm
Spring Force: 9 ±2 gf@load 0.6 mm
Mechanical Life: about 100000 cycles
Company Information:
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
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Stock: standard product. As usual, they are in stock.
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