High-current Probe Pogo Pin P264 Series for Electronic Test
Product Description
Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness big-current probes, etc.
Big-current probes are characterized by high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current.
Big-current probes manufactured by Centalic mainly include P203 ( OD of barrel is 2.03 mm. The below is same), P228, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P264-HP-7G(B).
The total length of P264-HP-7G(B) is 28.45 mm and outside diameter is 2.64 mm. This probe can withstand up to 24 amps and its typical maximum contact resistance is 50 milliohms. This probe is comprised of a barrel, a plunger and a spring, all of which are plated with gold and nickel.
For details, please check below parameters:
Technical Specifications:
Current rating: 24 amps, continuous
Contact resistance: 50 milliohms
Full stroke: 5.3 mm
Rated stroke: 3.5 mm
Spring force: 200gf (7 oz) @ load 3.5 mm
Materials (plated):
Contact Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Company information:
Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal
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Pogo Pin High-current Probe P350(300) Series for Electronic Test Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc. High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments. High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P350(300). This probe can withstand the current up to 24 Amps. And its typical maximum contact resistance is 70 milliohms. The materials used for the construction of this high-current test probe are different for each component: The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase. The spring is made of gold plated music wire. The plunger is made of beryllium copper, then gold and nickel plated. For details, please check parameters in below table. Technical Specifications Recommended Current Rating: 24 amps, continuous Contact Resistance: 70 milliohms, max Full Stroke: 5.5mm Rated Stroke: 3.6 mm Spring Force: 340 gf at load 3.6 mm Company Information: Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.