Spring Pins Suppliers and Manufacturers

Spring Loaded Pogo Pin Test Probe BIP68 Series for Battery Contact Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components. Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders. A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity. The products in this page are classified into BIP68 series of battery contact probes. The outside diameter is usually 0.68 mm and there are some common tip styles, for example J. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 0.95 mm (37 mil) Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms (Maximum) Full Stroke: 0.5 mm Rated Stroke: 0.4 mm Spring Force: 10 gf (0.35 oz) Materials Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: BeCu, Gold Plated Company information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

King pin kit

Double-Sided Spring Pogo Pin Test Probe SCPC031 Applied to Chip Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPC031 we will introduce is 0.31 mm in barrel diameter and 6.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 150 milliohms. The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 25 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 1.5 amps Contact Resistance: 150 milliohms max Bandwidth: 7.5 GHz at -1dB Inductance: 1MHZ at -0.05856 uH Captance: 1MHZ at 0.434274 uF Specifications: Full Stroke: 1 mm Rated Stroke: 0.65 mm Spring Force: 25�±5 gf at load 0.65 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Double-sided Spring Pogo Pin Test Probe SCPC058 for IC Test Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPC058 we will introduce is 0.58 mm in barrel diameter and 8.85 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from SUS304 plated with gold and nickel. This double-sided spring pogo pin could withstand the current up to 4 amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1.2 mm. But it is better to be pressed at a distance of 0.8 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.8 mm, the loaded force is about 35 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: Beryllium Copper, Au on Ni Plated Spring: SUS304, Au on Ni Plated Electronic Specification: Current Rating: 4 amps Contact Resistance: 100 milliohms max Bandwidth: 9.3 GHz at -1dB Inductance: 1MHZ at -0.02158 uH Captance: 1MHZ at 1.4027 uF Specifications: Full Stroke: 1.2 mm Rated Stroke: 0.8 mm Spring Force: 35�±7 gf at load 0.8 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Spring-loaded Pogo Pin In-circuit Test Probe PICT102-BK(7.6) for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PICT102-BK(7.6) series here. Its barrel diameter is 1.02 mm and the total length is 33 mm. The barrel of this pogo pin is made from phosphor bronze plated with gold and nickel. The plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This test probe could withstand the current up to 3 Amps. The typical maximal contact resistance is about 50 milliohms. The plunger can be pressed at a distance of up to 6.8 mm. But it is better to be pressed at a distance of 4.3 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 4.3 mm, the loaded force is about 205 gf, which fluctuates to a tolerance. For details, please check below parameters. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 6.8 mm Rated Stroke: 4.3 mm Spring Force: 205 gf (7 oz) at load 4.3 mm Materials Contact Barrel: Phosphor Bronze, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Plunger: SK4, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

In-circuit Test Probe Spring-loaded Pogo Pin PE100(115) for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PE100(115) series here. Its test center is 100 mil. The diameter is 1.36 mm and the total length is 36.5 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 2.54 mm (100 mil) Current Rating: 3 Amps, continuous Contact Resistance: 30 milliohms Mounting Hole Size: Diameter 1.75 mm Full Stroke: 6.5 mm Rated Stroke: 4.3 mm Spring Force: 200 gf (7.2 oz)/255 gf (9 oz)/284 gf (10 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Double-sided Spring Pogo Pin Test Probe SCPA030 Series Applied to IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA030 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from stainless steel plated with gold and nickel. This probe pin could withstand the current up to 1.5 Amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 2 mm. But it is better to be pressed at a distance of 0.85 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.85 mm, the loaded force is about 10 gf or 20 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: SK4, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SUS304, Au on Ni Plated Electronic Specification: Current Rating: 1.5 amps Contact Resistance: 100 milliohms max Bandwidth: 9.3 GHz at -1dB Inductance: 1MHZ at -0.02829 uH Captance: 1MHZ at -0.609436 uF Specifications: Full Stroke: 2 mm Rated Stroke: 0.85 mm Spring Force: 10�± 3 gf at load 0.85 mm, 20�± 6 gf at load 0.85 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.