Environmental changes have a great pact on the functionality and reliability of the electronic components, devices and systems. With normal temperature test is could happen that latent weak points are not detected as quickly as possible. Its efficient when test subjected to multiple, repaid changes. Temperature change from -70 °C to +220 °C can be achieved with the Doaho Thermal shock Test Chambers. Doaho Temperature Rapid Change Test Chambers are available with temperature change rates of 3 K/min to 25 K/min.
