Double-ended Pogo Pin Test Probe SCPA100 for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA100  we will introduce is 1  mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices.   Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.