Double-sided Spring Pogo Pin Test Probe SCPA021 Series for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA021 we will introduce is 0.21 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 200 milliohms. The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 12 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Ph/ SP, Au on Ni Plated Bottom Plunger: SK4, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on NI Plated Electronic Specification: Current Rating: 1 amp Contact Resistance: 200 milliohms max Bandwidth: 9.7 GHz at -1dB Inductance: 1MHZ at -0.05647 uH Captance: 1MHZ at 0.864722 uF Specifications: Full Stroke: 1.1 mm Rated Stroke: 0.65 mm Spring Force: 124 gf at load 0.65 mm Mechanical Life: about 100000 cycles semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Wire Harness Probe Spring-loaded Pogo Pin CHZ136-J Series Applied to Electronic Test Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CHZ136-J harness probe we will introduce here is 1.36 mm in diameter and 32.8 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel. This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 6.9 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 130 gf, namely 4.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 6.9 mm Rated Stroke: 4.6 mm Spring Force: 130�?�±40 gf (4.5 oz) at load 4.6 mm Materials (plated) Barrel: Brass, Au on Ni Plated Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
-high speed steel material guide ejector leader pin, giuded ejector shoulder leader pin, straight leader pin, -feature:4 time salt bath 1 time tempered Hardness: 58-60hrc Tolerance within 0.005mm -used for injection mould and casting mould . Din9861d, din1530d, din153oa, ah, jis, hasco, iso standard. Packing:bulk in cartons in pallet.
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Split pins are frequently used to secure other fasteners, e.g. clevis pins, as well as being used in combination with hardboard discs as a traditional joining technique for teddy bears.[6] common application of this is when used to secure a castellated nut. One problem with this type of use is that the castles on the nut must line up with the hole in the mating part so that the split pin can be installed. When the nut is torqued properly, but the holes still do not line up, it is preferable to overtighten the nut than undertighten it.
Barrel:brass, beryllium copper, phosphor bronze Plunger:brass, beryllium copper, phosphor bronze Spring:stainless steel, music wire Plating:gold, silver, palladium-nickel Flammability:ul94 v-0 Insulator:htn, lcp, pbt Pe bag (100pcs/pe bag) or as customer request
Turned parts bushes pins springs brass, components press parts castings sunex.
42 x 162 other sizes also available.
Spring pins and shafts for heavy commercial vehicles.
Mold components such as ejector pins, die springs, date calenders, taper interlocks, mould latches, ball cages.
Abp global exim deals in fasteners like nut, bolts, screws, studs, hex nuts, ,circlips, pins, washers, spring washer, turned parts, machining parts in steel, stainless steel, copper, brass, aluminum etc..
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