Gold-plated Probe Pogo Pin PE100(90) Series for In-circuit Test In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PE100(90) series here. Its test center is 100 mil. The diameter is 1.36 mm and the total length is 34 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 2.54 mm (100 mil) Current Rating: 3 Amps, continuous Contact Resistance: 30 milliohms Mounting Hole Size: Diameter 1.75 mm Full Stroke: 6.5 mm Rated Stroke: 4.3 mm Spring Force: 284 gf (10 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
In-circuit Test Probe Spring-loaded Pogo Pin PE100(115) for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PE100(115) series here. Its test center is 100 mil. The diameter is 1.36 mm and the total length is 36.5 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 2.54 mm (100 mil) Current Rating: 3 Amps, continuous Contact Resistance: 30 milliohms Mounting Hole Size: Diameter 1.75 mm Full Stroke: 6.5 mm Rated Stroke: 4.3 mm Spring Force: 200 gf (7.2 oz)/255 gf (9 oz)/284 gf (10 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
In-circuit Test Probe Pogo Pin P085 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe P085 series here. Its diameter is 0.82 mm and the total length is 37 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Rated Stroke: 2 mm Spring Force: 130 gf (5oz) Materials Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: BeCu, Gold Plated For more information, please check below catalog. Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
In-circuit Test Probe Pogo Pin P156 Series for PCB Assembly Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQ156 series here. Its test center is 156 mil. The diameter is 2.36 mm and the total length is 33.79 mm. Various tip styles, for example, B, C, G, J, K, L, T, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, WW and WW-L, to fit each test probe For details, please check below parameters. Technical Specifications Recommended Minimum Center: 3.96 mm (156 mil) Current Rating: 5 Amps, continuous Contact Resistance: 50 milliohms Mounting Hole Size: 2.75 mm Full Stroke: 6.35 mm Rated Stroke: 4.32 mm Spring Force: 113/198/255/285 gf (4/7/9/10 oz) Materials Receptacle: Phosphor Bronze, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
In-circuit Test Probe Pogo Pin P078 Series for Printed Circuit Board Assembly In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe P078-BK-346 series here. The diameter is 0.78 mm and the total length is 34.6 mm. Various tip styles, for example, BK, H, S, T, E, C, U, G, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 6.9 mm Rated Stroke: 4.6 mm Spring Force: 200 gf (7 oz) at load 4.6 mm Materials Contact Barrel: Phosphor Bronze, Ni Plated Spring: SWP-A/B, Au on Ni Plated Plunger: SK4, Au on Ni Plated Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
In-circuit Test Probe Pogo Pin PQ100 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQ100 series here. Its test center is 100 mil. The diameter is 1.36 mm � and the total length is � 33.25 mm. Various tip styles, for example, H, K, L, BK, etc., are available for test probes. There are four types of receptacles, namely CR, SC, SW and WW, to fit each test probe. For details � please check below parameters. Technical Specifications Recommended Minimum Center: 2.54 mm (100 mil) Current Rating: 3 Amps, continuous Contact Resistance: 30 milliohms Mounting Hole Size: 1.75 mm Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 100/120/156/203/255/284/312 gf (3.5/4/5.5/7.2/9/10/11 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world Welcome to browse our website � and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal
In-circuit Test Probe Pogo Pin PICT75 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PICT75� series here. Its� diameter is 1 mm� and the total length is 21 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, CRW� and SW� to fit each test probe.� For details, please check below parameters. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 150 milliohms Full Stroke: 4 mm Rated Stroke: 2.65 mm Spring Force:� 130 gf (4.5 oz) at load 2.65 mm Materials Contact Barrel: Phosphor Bronze, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Plunger: BeCu, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
In-circuit Test Probe Pogo Pin PE50 for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
In-circuit Test Probe Pogo Pin PE75 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PE75 series here. Its test center is 75 mil. The diameter is 1.91 mm and the total length is 33.1 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.91 mm (75 mil) Current Rating: 3 Amps, continuous Contact Resistance: 40 milliohms Mounting Hole Size: Diameter 1.35 mm Full Stroke: 6.4 mm Rated Stroke: 4.3 mm Spring Force: 150 gf (5.5 oz)/200 gf (7.2 oz)/227 gf (8 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: BeCu, Nickel Plated or Gold Plated semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
SANDI SERIES charging module is for electric vehicle charging station. With single-phase non neutral conductor AC input, it has the advantages of high efficiency, high power density and low harmonic. Functional details 1. Hot plug Plug technology is applied to the charging module to provide convenience for installation and maintenance. The access of the charging module to the system shall not disturb the output voltage of the system. 2. Advanced current sharing technology Under constant voltage working mode, the charging modules can share current automatically within 10S, with degree of unbalance less than �±0.5A. 3. Control of input limited power Refer to Fig. 1-10 for the relation between the output power and input voltage of the charging module. When the input voltage is within 360 Vac ~ 450 Vac (return difference is less than 5V), the module can output the maximum power of 20 KW; when the input voltage is within 260 Vac ~ 320 Vac, the module can still work normally under limited power mode. 4. Control of output constant power When there is a rated input voltage, the output power of the module is 20 KW. Refer to Fig. 11 for the relation between the output voltage and the output current of the module. The SD75050 module uses two operating modes with output voltage ranges of 50 to 750V. The module only selects the operating mode based on the value of the received demand voltage, and does not select the operating mode based on the actual output voltage. 5. Temperature limited power 6. Regulation of output current limiting point 8. Regulation of output voltage The output voltage of the module can be regulated constantly through the external monitoring module, with regulation range of 50Vdc ~ 750Vdc and minimum regulation step of 0.1 Vdc. 9. Fan control The built-in processor of the module can regulate the speed of the fan according to the internal temperature and output current of the module. 10. Protection of input overvoltage/ voltage shortage 11. Output overvoltage protection The overvoltage protection point is 260Vdc ~770Vdc ( +10 Vdc). Default is 778Vdc.The module can be started after manual intervention upon overvoltage protection. 12. Over-temperature protection The environmental over-temperature protection point is 80 C. When the DC panel has a temperature over 100 C, the module will stop working; when the DC panel has a temperature below 90 C, the module will automatically work again. 13. Protection of internal bus fault When the internal bus voltage of the module is beyond the overvoltage/ voltage shortage protection point, the module will be powered off automatically. At this time, there is no output from the module and the fault indicator light is on. 14. Short circuit protection In case of short circuit of the module, it will be subjected to protective shutdown and the red indicator light of the panel is on, and this condition will be transmitted to the monitor of the "module fault".
Test Probe Pogo Pin PL50 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PL50 series here. Its test center is 50 mil, namely 1.27 mm. The diameter is 0.68 mm and the total length is 27.53 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles, namely CR, VCR, SC, VSC, CRW and VCRW, to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Mounting Hole Size: Diameter 0.95 mm Full Stroke: 3.7 mm Rated Stroke: 2.54 mm Spring Force: 28/56/85 gf (1/2/3 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper/SK4, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Semiconductor Test Probe Pogo Pin SCPC035 Series for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPC035 we will introduce is 0.35 mm in barrel diameter and 7.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2.5 amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.5 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.5 mm, the loaded force is about 18 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel Phosphor Bronze, Au on Ni Plated Bottom Plunger Beryllium Copper, Au on Ni Plated Top Plunger Beryllium Copper, Au on Ni Plated Spring SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating 2.5 amps Contact Resistance 100 milliohms max Bandwidth 5.8 GHz at -1dB Inductance 1MHZ at -0.01039 uH Captance 1MHZ at 2.35287 uF Specifications: Full Stroke 1 mm Rated Stroke 0.5 mm Spring Force 18 �±5 gf at load 0.5 mm Mechanical Life about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
PCBA Test Probe Pogo Pin P166 Series Applied to ICT In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe P166 series here. Its diameter is 1.66 mm and the total length is 48.4 mm. Various tip styles, for example, B3, H, S, T, E, C, U, G, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Rated Stroke: 5 mm Spring Force: 500 gf (11 oz) Materials Contact Barrel: Brass, Nickel Plated Spring: Music Wire, Nickel Plated Plunger: Steel, Nickel Plated semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Printed Circuit Board Assembly Test Probe Pogo Pin PQ75 Series Applied to ICT In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQ75 series here. Its test center is 75 mil. The diameter is 1.02 mm and the total length is 33.02 mm. Various tip styles, for example, H, K, L, BK, etc., are available for test probes. There are three types of receptacles, namely CR, SC and WW, to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.91 mm (75 mil) Current Rating: 3 Amps, continuous Contact Resistance: 40 milliohms Mounting Hole Size: Diameter 1.35 mm Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 112/150/198 gf (4/5.5/7 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Semiconductor Test Probe Pogo Pin SCPA030 Series for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA030 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 10 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Ph/ SP, Au on Ni Plated Bottom Plunger: BeCu, Au on Ni Plated Top Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 2 amps Contact Resistance: 100 milliohms max Bandwidth: 7.1 GHz at -1dB Inductance: 1MHZ at -0.02524 uH Captance: 1MHZ at 1.12735 uF Specifications: Full Stroke: 1.1 mm Rated Stroke: 0.65 mm Spring Force: 10 ±3 gf at load 0.65 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Pogo Pin Semiconductor Test Probe SCPA025 Series for IC Test Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA025 we will introduce is 0.25 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 14 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel�¯�¼? Ph/SP, Au on Ni Plated Bottom Plunger�¯�¼? BeCu, Au on Ni Plated Top Plunger BeCu, Au on Ni Plated Spring SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating 1 amp Contact Resistance 100 milliohms max Bandwidth ? 9.3 GHz at -1dB Inductance 1MHZ at -0.02384 uH Captance 1MHZ at 1.06747 uF Specifications: Full Stroke 1.1 mm Rated Stroke 0.65 mm Spring Force 4 gf at load 0.65 mm Mechanical Life about 100000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Battery Contact Probe Test Pogo Pin BIP48 for Connector Application Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components. Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders. A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity. The products in this page are classified into BIP48 series of battery contact probes. The outside diameter is usually 4.8 mm and total length is 6.8 mm. There are some common tip styles, for example J. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 5.95 mm (235 mil) Current Rating: 5 Amps, continuous Contact Resistance: 30 milliohms (Maximum) Full Stroke: 2.15 mm Rated Stroke: 1.27 mm Spring Force: 23 gf (0.8 oz)/ 56 gf ( 2 oz) Materials Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Brass, Gold Plated semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Double-ended Pogo Pin Test Probe SCPA058 Series for Semiconductor Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. SCPA058 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. Its parameters are as below. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: Beryllium Copper, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 3.5 Amps Contact Resistance: 100 milliohms, max Bandwidth: 8.5 GHz at -1dB Propagation Delay: 21 ps Inductive Reactance: 1MHZ at -0.02506 uH Capacitive Reactance: 1MHZ at -1.01245 uF Specifications: Full Stroke: 1.1 mm Rated Stroke: 0.65 mm Spring Force: 25�±7 gf at load 0.65 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
PCBA Assembly Test Probe Pogo Pin PQL50 Series Applied to ICT In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQL50 series here. Its diameter is 0.78 mm and the total length is 43.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles to fit the probes, for instance, CR, SW, CRW and WW. The plunger can be pressed at a distance of up to 6.35 mm. But it is better to be pressed at a distance of 4.3 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 4.3 mm, the loaded force is about 5.5 oz, 7 oz or 8 oz, which fluctuates to a tolerance. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 60 milliohms Mounting Hole Size: Diameter 1 mm Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 150 gf (5.5 oz)/ 185 gf (7 oz)/ (227 gf (8 oz) Materials Receptacle: Phosphor Bronze, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Switch Probe Pogo Pin SWP164 for Electronic Test Switching Probes is a kind of functional probes. They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc. Their application field is mainly as below Wire harness connector PCB component detection Door open-close switch Fixture component detection Automation process sensing Position and retention force Below switching probe we will introduce is SWP164. Its diameter is 1.64 mm and total length is 44.65 mm. As usual, switching probes do not entail very high currents, and this model SWP260 can work with the current up to 3 A. The typical maximum contact resistance of this model SWP164 is 160 m. The materials used for the construction of switching probes are different for each component: The barrel is made of brass. Subsequently gold plated during the galvanic plating phase. The spring is made of gold plated music wire. The plunger is made of Beryllium Copper, then gold and nickel plated. The insulating sleeve is made of POM For details of SWP164 switching probe, please check below parameters. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 160 milliohms, maximum Full Stroke: 5 mm Rated Stroke: 3.3 mm Spring Force: 130 gf (4.5 oz) Normal Condition: Disconnecting between Plunge 1 and Plunger 2 Press down 1 mm: Continuity between Plunger 1 and Plunger 2 Materials Contact Barrel: Brass, Au on Ni Plated Spring: SWP, Au on Ni Plated Plunger 1: Beryllium Copper, Au on Ni Plated Plunger 2: Beryllium Copper, Au on Ni Plated Insulating Sleeve: POM Advantages of this switching probe Reliable performance Low cost of test Best yield Our company are also able to change the head shape, total length and diameter, etc., of our switching probes to facilitate their use in different applications. The pitch of installation of switch probes depends on your specific needs. Company Information Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
