Double Ended Pogo Pin Test Probe Scfb029(40) Suppliers and Manufacturers

Double-Ended Pogo Pin Test Probe SCFB029(40) for Chip Inspection Semiconductor test probes are usually called double-ended pogo pins � Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. SCPB029(40) is unique in shape among semiconductor test probes due to a convex ring at one end of its barrel. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. �  Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production �  Its parameters are as below. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on NI Plated Electronic Specification: Current Rating: 2 amps Contact Resistance: 100 milliohms max Bandwidth: 8.5 GHz@-1dB Inductance: 1MHZ@-0.02661uH Captance: 1MHZ@0.925374uF Specifications: Full Stroke: 1 mm Rated Stroke: 0.65 mm Spring Force: 14 �±4 gf@load 0.65 mm Mechanical Life: about 100000 cycles Company Information: Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal

TECHNICAL SPECIFICATION DATA SHEET: PROPERTY TEST ASTM TEST METHOD API @ 60 F 30- 45 ASTM D-1298 Sulfur (wt%) max 0.8 ASTM D-4294 BS &W % max 2.0 Paraffins (vol. %) 40 -70 ASTM D-2789M Naphthenes (vol. %) > 25 ASTM D-2789M Organic Chloride(ppm) < 1.0 ASTM D-4929 Organic Nitrogen max (ppm) 500 ASTM D-4629 Microcarbon Residue (MCRT) 2.0 Max ASTM D-4530 Light ends C2 â?? iC5 5 % Max Total Acid Number, mg KOH 0.8 ASTM D-664 Metals by ICP ASTM D-5708 Vanadium

MOQ: 10,000 Barrels per Month Supply Ability: 1,000,000 Barrels per Month JP54 Technical Specifications: ADDITIVES Antioxidant in hydro processed fuel mg/l min 17 max 24 Antioxidant non hydro processed fuel mg/l max 24 Static dissipater first doping ASA- 3 mg/l max 1 Stadis 450 mg/l max 3 COMBUSTION PROPERTIES Specific energy, net mi/kg min 18.4 D 4808 Smoke point mm min 19 D 1322 Lumininomitter number min 45 D 1740 Naphtales % vol max 3 D 1840 Propriety unit min max result test ip method ASTM COMPOSITION Total acidity mg KOH /g max 0.01 354 D 3242 Aromatic % vol max 22.0 158 D 1318 Sulphur, total % mass max 0.30 107 D 1266/2622 Sulphur mercaptan % mass max 0.003 342 D 3227 Doctor test 30 D 4952 VOLATILITY Initial boiling point centigrade max report 123 D 96 10% vol at C 240 20% vol at C report 50% vol at C report 80% vol at C report End point centigrade max 42 170/303 D 56 / 3828 Density at 15 C kg m2 min /max 776/840 180/385 D 1298 LOW TEMPERATURES PROPERTIES freezing point centigrade max 40 15 D 1298 Corrosion copper (2hrs at 100 C) Corrosion silver (4 hrs at 500C) max 1 227 STABILITY Thermal stability control temp. 280C 323 Filter pressure, differential mm. Hg max 25 Tube deposit rating (visual) max

Electronic Test Probe Double-ended Pogo Pin SCPE025 Series for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPE025 we will introduce is 0.25 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 0.5 Amp. The typical maximal contact resistance is about 250 milliohms. The plunger can be pressed at a distance of up to 1.9 mm. But it is better to be pressed at a distance of 1.25 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 1.25 mm, the loaded force is about 12 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze/ Gold Clad Phosphor Bronze, Au on Ni Plated X: Bottom (Plunger 1): SK4, Au on Ni Plated Y: Top (Plunger 2): SK4, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 0.5 amp Contact Resistance: 250 milliohms max Bandwidth: 10.8 GHz at -1dB Inductive Reactance: 1MHZ at -0.07234 uH Capacitive Reactance: 1MHZ at 0.329458 uF Specifications: Full Stroke: 1.9 mm Rated Stroke: 1.25 mm Spring Force: 12 �±4 gf at load 1.25 mm Mechanical Life: about 100000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Double-ended Pogo Pin Test Probe SCPA100 for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA100  we will introduce is 1  mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices.   Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

Double-ended Pogo Pin Test Probe SCPA058 Series for Semiconductor Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. SCPA058 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. Its parameters are as below. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: Beryllium Copper, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 3.5 Amps Contact Resistance: 100 milliohms, max Bandwidth: 8.5 GHz at -1dB Propagation Delay: 21 ps Inductive Reactance: 1MHZ at -0.02506 uH Capacitive Reactance: 1MHZ at -1.01245 uF Specifications: Full Stroke: 1.1 mm Rated Stroke: 0.65 mm Spring Force: 25�±7 gf at load 0.65 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Electronic Test Probe Double-ended Pogo Pin SCPC030(50)-XX-67 for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPC030(50)-XX-67 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.8 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.8 mm, the loaded force is about 12 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Ph, Au on Ni Plated Bottom Plunger: BeCu, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 1.5 amps Contact Resistance: 100 milliohms max Bandwidth: 7.5 GHz at -1dB Inductance: 1MHZ at -0.05032 uH Captance: 1MHZ at 0.502464 uF Specifications: Full Stroke: 1 mm Rated Stroke: 0.8 mm Spring Force: 12�?�±3 gf at load 0.8 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

We are one of the most trusted manufacturer and supplier of copper fittings and flanges in India. We offer wide range of copper fittings comprises of copper flanges, copper pipe fittings, copper tube fittings and copper forged fittings which provide an economic and efficient method of changing directions in a wide spectrum of domestic and commercial applications ranging from air conditioning, refrigeration, heating, fluid distribution, air pressure lines and plumbing etc. Our fittings have no rough surfaces, present a neat appearance, heat more rapidly, and provide better flexibility to the installer to install and join the copper tube at appropriate place. Grade: â?¢ ASTM / ASME SB 61 UNS NO. C 92200 â?¢ ASTM / ASME SB 62 UNS NO. C 83600 â?¢ ASTM / ASME SB 151 UNS NO. 70600, 71500, C 70600 (cu-ni-90/10), C 71500 (cu-ni-70/30), â?¢ ASTM / ASME SB 152 UNS NO. C 10100, C 10200, C 10300, C 10800, C 12000 & C 12200. Specifications: Fittings: (butt weld, socketweld & threaded) 45 deg elbow, 45 deg long bend, 90 deg elbow, 90 deg long bend, 180 deg u bend, concentric reducer, eccentric reducer, equal tee, unequal tee, end cap / pipe cap, union, nipple, swage nipple, full & half coupling, cross, plug, bush, etc.Flanges: Slip-On (SORF), Blind (BLRF), Socket weld (SWRF), Weldneck (WNRF), Screwed (SERF), Lapped Joint (LJFF), Weldneck Ring Joint (WNRTJ), Long Weld Neck, Orifice, Spectacle Blind, Ring Joint, Threaded, etc. Fittings: 15 mm NB to 600 NB in schedule 5, 10, 20, 30, 40, 80, etc Flanges: 15 mm NB to 600 mm NB in 150#, 300#, 600#, 900, 1200#, Table D, Table E, Table F, Table G Test Certificate: MTC, TC from government approved Laboratory under Third Party Inspection.

Double-Sided Spring Pogo Pin Test Probe SCPC031 Applied to Chip Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPC031 we will introduce is 0.31 mm in barrel diameter and 6.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 150 milliohms. The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 25 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 1.5 amps Contact Resistance: 150 milliohms max Bandwidth: 7.5 GHz at -1dB Inductance: 1MHZ at -0.05856 uH Captance: 1MHZ at 0.434274 uF Specifications: Full Stroke: 1 mm Rated Stroke: 0.65 mm Spring Force: 25�±5 gf at load 0.65 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Double-sided Spring Pogo Pin Test Probe SCPC058 for IC Test Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPC058 we will introduce is 0.58 mm in barrel diameter and 8.85 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from SUS304 plated with gold and nickel. This double-sided spring pogo pin could withstand the current up to 4 amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1.2 mm. But it is better to be pressed at a distance of 0.8 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.8 mm, the loaded force is about 35 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: Beryllium Copper, Au on Ni Plated Spring: SUS304, Au on Ni Plated Electronic Specification: Current Rating: 4 amps Contact Resistance: 100 milliohms max Bandwidth: 9.3 GHz at -1dB Inductance: 1MHZ at -0.02158 uH Captance: 1MHZ at 1.4027 uF Specifications: Full Stroke: 1.2 mm Rated Stroke: 0.8 mm Spring Force: 35�±7 gf at load 0.8 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Double-sided Spring Pogo Pin Test Probe SCPA030 Series Applied to IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA030 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from stainless steel plated with gold and nickel. This probe pin could withstand the current up to 1.5 Amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 2 mm. But it is better to be pressed at a distance of 0.85 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.85 mm, the loaded force is about 10 gf or 20 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: SK4, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SUS304, Au on Ni Plated Electronic Specification: Current Rating: 1.5 amps Contact Resistance: 100 milliohms max Bandwidth: 9.3 GHz at -1dB Inductance: 1MHZ at -0.02829 uH Captance: 1MHZ at -0.609436 uF Specifications: Full Stroke: 2 mm Rated Stroke: 0.85 mm Spring Force: 10�± 3 gf at load 0.85 mm, 20�± 6 gf at load 0.85 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.