3. It can be used as an extension adapter to put the monitor further away from the tower.
4. Excellent for applications with limited space or offices with cubicles.For example Perfect for TVs that are very close to the wall, 90 Degree angle. 5. Connects the PC or laptop to the projector, LCD monitor, and other video display system through VGA connections.
90 angle makes it easy to set up displays or monitors in an orderly and organized manner. Easy way to connect your PC to the screen without tangled or in-the-way wires.
Why spend the time wiring each PLC I/O point to a terminal block when you can get those connections prewired? STC-Cable pre-wired cables and modules save you valuable time, keep your installation clean and efficient, and use half the space at a fraction of the cost of standard terminal blocks.
PCBA Test Probe Pogo Pin P166 Series Applied to ICT
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe P166 series here. Its diameter is 1.66 mm and the total length is 48.4 mm. Various tip styles, for example, B3, H, S, T, E, C, U, G, etc., are available for test probes.
For details, please check below parameters.
Technical Specifications
Recommended
Rated Stroke: 5 mm
Spring Force: 500 gf (11 oz)
semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
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Spring Pin Battery Contact Probe BIP85 Series for Connector Application
Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.
Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.
A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.
The products in this page are classified into BIP85 series of battery contact probes. The outside diameter is usually 0.85 mm and there are some common tip styles, for example J.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms (Maximum)
Full Stroke: 0.5/1.5 mm
Rated Stroke: 0.34/1 mm
Spring Force: 28/ 48 gf (1/ 1.78 oz)
radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Printed Circuit Board Assembly Test Probe Pogo Pin PQ75 Series Applied to ICT
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PQ75 series here. Its test center is 75 mil. The diameter is 1.02 mm and the total length is 33.02 mm. Various tip styles, for example, H, K, L, BK, etc., are available for test probes. There are three types of receptacles, namely CR, SC and WW, to fit each test probe.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.91 mm (75 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms
Mounting Hole Size: Diameter 1.35 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 112/150/198 gf (4/5.5/7 oz)
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Electronic Test Probe Pogo Pin PSICT39 Series for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PSICT39 series here. The diameter is 0.61 mm and the total length is 19.5 mm. Various tip styles, for example, B, H, S, T, E, C, U, G, etc., are available for test probes.
For details, please check below parameters.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 70 milliohms
Full Stroke: 4 mm
Rated Stroke: 2.5 mm
Spring Force: 70 gf (2.5 oz) at load 2.5 mm
Materials
Receptacle: Brass, Au on Ni Plated
Contact Barrel: Phosphor Bronze, Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
For more information, please check below catalog.
Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
In-circuit Test Probe Pogo Pin P078 Series for Printed Circuit Board Assembly
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe P078-BK-346 series here. The diameter is 0.78 mm and the total length is 34.6 mm. Various tip styles, for example, BK, H, S, T, E, C, U, G, etc., are available for test probes.
For details, please check below parameters.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.9 mm
Rated Stroke: 4.6 mm
Spring Force: 200 gf (7 oz) at load 4.6 mm
Materials
Contact Barrel: Phosphor Bronze, Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Plunger: SK4, Au on Ni Plated
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
High-Current Probe Pogo Pin P350(150) for Electronic Test
Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc.
High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments.
High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P350(150)-H-14G(C) This probe can withstand the current up to 20 Amps. And its typical maximum contact resistance is 50 milliohms.
The materials used for the construction of this high-current test probe are different for each component:
The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase.
The spring is made of gold plated music wire.
The plunger is made of SK4, then gold and nickel plated.
The plunger tip is made of brass, then gold and nickel plated.
For details, please check parameters in below table.
Technical Specifications
Recommended
Current Rating: 20 amps, continuous
Contact Resistance: 50 millohms, max
Full Stroke: 7.5 mm
Rated Stroke: 5 mm
Spring Force: 397 gf at load 5 mm
Company Information:
in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Double-sided Spring Pogo Pin Test Probe SCPA021 Series for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA021 we will introduce is 0.21 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 200 milliohms.
The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 12 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Ph/ SP, Au on Ni Plated
Bottom Plunger: SK4, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on NI Plated
Electronic Specification:
Current Rating: 1 amp
Contact Resistance: 200 milliohms max
Bandwidth: 9.7 GHz at -1dB
Inductance: 1MHZ at -0.05647 uH
Captance: 1MHZ at 0.864722 uF
Specifications:
Full Stroke: 1.1 mm
Rated Stroke: 0.65 mm
Spring Force: 124 gf at load 0.65 mm
Mechanical Life: about 100000 cycles
semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Welcome to wholesale high quality Semiconductor Refrigeration Technology Training Device at competitive price from professional Semiconductor Refrigeration Technology Training Device manufacturers and suppliers in China. Contact our factory for quotation and pricelist. We...
Semiconductor Test Probe Double-ended Pogo Pin SCPE015 for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPE015 is the tiniest series in semiconductor test probes since its outside diameter is only 0.15mm. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices  Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
Its parameters are as below.
Materials (plated)
Barrel: Gold Clad, No Plated
X-Bottom (Plunger 1): Pd, No Plated
Y-Top (Plunger 2): Pd, No Plated
Spring: SWP, Au on Ni Plated
Electronic Specification:
Current Rating: 0.5 amp
Contact Resistance: 250 milliohms max
Bandwidth: 11.4 GHz@-1dB
Inductance: 1MHZ@-0.06439uH
Captance: 1MHZ@0.364375uF
Specifications:
Full Stroke: 0.8 mm
Rated Stroke: 0.6 mm
Spring Force: 9 ±2 gf@load 0.6 mm
Mechanical Life: about 100000 cycles
Company Information:
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.
Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal
Technical specification, manuals and data sheets: Available on request.
About our company:
We are the supplier for industrial automation spare parts.We specialize in PLC module, DCS card pieces, ESD system card pieces, vibration monitoring system card pieces, steam turbine control system module, gas generator spare parts, we have established the relationship with famouse PLC DCS product maintenance service providers in the world.
1. 10 years sales experience in control system components field.
2. High efficiency application.
4. Reduce the intermediate links between each other.
5. Professional sales team and quality customer service team.
6. Wide products range, nearly 70 million inventory parts for customers worldwide.
