Gold Plated Pogo Pin PCBA Probe PE75(PO) Series for In-circuit Test In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PE75(PO) series here. Its test center is 75 mil. The diameter is 1 mm and the total length is 33 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.91 mm (75 mil) Current Rating: 3 Amps, continuous Contact Resistance: 40 milliohms Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 155 gf (5.5 oz)/203 gf (7.2 oz)/227 gf (8 oz)/300 gf (10 oz) Materials Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
