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Printed Circuit Board Assembly Test Probe Pogo Pin PQ75 Series Applied to ICT In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQ75 series here. Its test center is 75 mil. The diameter is 1.02 mm and the total length is 33.02 mm. Various tip styles, for example, H, K, L, BK, etc., are available for test probes. There are three types of receptacles, namely CR, SC and WW, to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.91 mm (75 mil) Current Rating: 3 Amps, continuous Contact Resistance: 40 milliohms Mounting Hole Size: Diameter 1.35 mm Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 112/150/198 gf (4/5.5/7 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Test Probe Pogo Pin PL50 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PL50 series here. Its test center is 50 mil, namely 1.27 mm. The diameter is 0.68 mm and the total length is 27.53 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles, namely CR, VCR, SC, VSC, CRW and VCRW, to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Mounting Hole Size: Diameter 0.95 mm Full Stroke: 3.7 mm Rated Stroke: 2.54 mm Spring Force: 28/56/85 gf (1/2/3 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper/SK4, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

PCBA Test Probe Pogo Pin P166 Series Applied to ICT In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe P166 series here. Its diameter is 1.66 mm and the total length is 48.4 mm. Various tip styles, for example, B3, H, S, T, E, C, U, G, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Rated Stroke: 5 mm Spring Force: 500 gf (11 oz) Materials Contact Barrel: Brass, Nickel Plated Spring: Music Wire, Nickel Plated Plunger: Steel, Nickel Plated semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

In-circuit Test Probe Pogo Pin P078 Series for Printed Circuit Board Assembly In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe P078-BK-346 series here. The diameter is 0.78 mm and the total length is 34.6 mm. Various tip styles, for example, BK, H, S, T, E, C, U, G, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 6.9 mm Rated Stroke: 4.6 mm Spring Force: 200 gf (7 oz) at load 4.6 mm Materials Contact Barrel: Phosphor Bronze, Ni Plated Spring: SWP-A/B, Au on Ni Plated Plunger: SK4, Au on Ni Plated Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Semiconductor Test Probe Pogo Pin SCPC035 Series for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPC035 we will introduce is 0.35 mm in barrel diameter and 7.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2.5 amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.5 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.5 mm, the loaded force is about 18 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel Phosphor Bronze, Au on Ni Plated Bottom Plunger Beryllium Copper, Au on Ni Plated Top Plunger Beryllium Copper, Au on Ni Plated Spring SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating 2.5 amps Contact Resistance 100 milliohms max Bandwidth 5.8 GHz at -1dB Inductance 1MHZ at -0.01039 uH Captance 1MHZ at 2.35287 uF Specifications: Full Stroke 1 mm Rated Stroke 0.5 mm Spring Force 18 �±5 gf at load 0.5 mm Mechanical Life about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Semiconductor Test Probe Pogo Pin SCPA030 Series for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA030 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 10 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Ph/ SP, Au on Ni Plated Bottom Plunger: BeCu, Au on Ni Plated Top Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 2 amps Contact Resistance: 100 milliohms max Bandwidth: 7.1 GHz at -1dB Inductance: 1MHZ at -0.02524 uH Captance: 1MHZ at 1.12735 uF Specifications: Full Stroke: 1.1 mm Rated Stroke: 0.65 mm Spring Force: 10 ±3 gf at load 0.65 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

In-circuit Test Probe Pogo Pin P085 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe P085 series here. Its diameter is 0.82 mm and the total length is 37 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Rated Stroke: 2 mm Spring Force: 130 gf (5oz) Materials Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: BeCu, Gold Plated For more information, please check below catalog. Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Pogo Pin Semiconductor Test Probe SCPA025 Series for IC Test Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA025 we will introduce is 0.25 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 14 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel�¯�¼? Ph/SP, Au on Ni Plated Bottom Plunger�¯�¼? BeCu, Au on Ni Plated Top Plunger BeCu, Au on Ni Plated Spring SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating 1 amp Contact Resistance 100 milliohms max Bandwidth ? 9.3 GHz at -1dB Inductance 1MHZ at -0.02384 uH Captance 1MHZ at 1.06747 uF Specifications: Full Stroke 1.1 mm Rated Stroke 0.65 mm Spring Force 4 gf at load 0.65 mm Mechanical Life about 100000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Single-headed Pogo Pin Test Probe PQ50 Series for PCBA Inspection In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQ50 series here. Its diameter is 0.78 mm and the total length is 34.6 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 60 milliohms Mounting Hole Size: Diameter 1 mm Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 85 gf (3 oz) /122 gf (4 oz)/ 150 gf (5.5 oz) at load 4.3 mm Materials Receptacle: Phosphor Bronze, Au on Ni Plated Contact Barrel: Phosphor Bronze, Au on Ni Plated Spring: Music Wire, Au on Ni Plated Plunger: Beryllium Copper, Gold Plated or Nickel Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

PCBA Test Probe Pogo Pin PL75 Series Applied to ICT In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PL75 series here. Its test center is 75 mil. The diameter is 1.02 mm and the total length is 27.83 mm. Various tip styles, for example, H, K, L, BK, etc., are available for test probes. There are roughly six types of receptacles, namely CR, VCR, SC, VSC, WW and VWW to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.91 mm (75 mil) Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Mounting Hole Size: Diameter 1.35 mm Full Stroke: 4 mm Rated Stroke: 2.54 mm Spring Force: 113 gf (4 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper/SK4, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Battery Contact Probe Test Pogo Pin BIP48 for Connector Application Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components. Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders. A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity. The products in this page are classified into BIP48 series of battery contact probes. The outside diameter is usually 4.8 mm and total length is 6.8 mm. There are some common tip styles, for example J. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 5.95 mm (235 mil) Current Rating: 5 Amps, continuous Contact Resistance: 30 milliohms (Maximum) Full Stroke: 2.15 mm Rated Stroke: 1.27 mm Spring Force: 23 gf (0.8 oz)/ 56 gf ( 2 oz) Materials Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Brass, Gold Plated semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Gold-plated Probe Pogo Pin PE100(90) Series for In-circuit Test In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PE100(90) series here. Its test center is 100 mil. The diameter is 1.36 mm and the total length is 34 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 2.54 mm (100 mil) Current Rating: 3 Amps, continuous Contact Resistance: 30 milliohms Mounting Hole Size: Diameter 1.75 mm Full Stroke: 6.5 mm Rated Stroke: 4.3 mm Spring Force: 284 gf (10 oz) Materials Receptacle: Brass, Gold Plated Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Double-ended Pogo Pin Test Probe SCPA058 Series for Semiconductor Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. SCPA058 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. Its parameters are as below. Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: Beryllium Copper, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 3.5 Amps Contact Resistance: 100 milliohms, max Bandwidth: 8.5 GHz at -1dB Propagation Delay: 21 ps Inductive Reactance: 1MHZ at -0.02506 uH Capacitive Reactance: 1MHZ at -1.01245 uF Specifications: Full Stroke: 1.1 mm Rated Stroke: 0.65 mm Spring Force: 25�±7 gf at load 0.65 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

PCBA Assembly Test Probe Pogo Pin PQL50 Series Applied to ICT In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQL50 series here. Its diameter is 0.78 mm and the total length is 43.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles to fit the probes, for instance, CR, SW, CRW and WW. The plunger can be pressed at a distance of up to 6.35 mm. But it is better to be pressed at a distance of 4.3 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 4.3 mm, the loaded force is about 5.5 oz, 7 oz or 8 oz, which fluctuates to a tolerance. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 60 milliohms Mounting Hole Size: Diameter 1 mm Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 150 gf (5.5 oz)/ 185 gf (7 oz)/ (227 gf (8 oz) Materials Receptacle: Phosphor Bronze, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.