Double-sided Spring Pogo Pin Test Probe SCPA021 Series for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPA021 we will introduce is 0.21 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 200 milliohms. The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 12 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Ph/ SP, Au on Ni Plated Bottom Plunger: SK4, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on NI Plated Electronic Specification: Current Rating: 1 amp Contact Resistance: 200 milliohms max Bandwidth: 9.7 GHz at -1dB Inductance: 1MHZ at -0.05647 uH Captance: 1MHZ at 0.864722 uF Specifications: Full Stroke: 1.1 mm Rated Stroke: 0.65 mm Spring Force: 124 gf at load 0.65 mm Mechanical Life: about 100000 cycles semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Cable Harness Probe Pogo Pin CH136-J for the Tests of Automotive Industry Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel. This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 5.3 mm at most when this probe works, although the plunger can move as far as 8 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 5.3 mm, its loaded force is about 57 gf, namely 2 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 8 mm Rated Stroke: 5.3 mm Spring Force: 57±17 gf (2 oz) at load 5.3 mm Materials (plated) Barrel: Brass, Au on Ni Plated Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Cable Harness Probe Pogo Pin CH200-H(14) for the Tests of Automotive Industry Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CH200 harness probe we will introduce here is 1.99 mm in diameter and 39 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel. This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.5 mm at most when this probe works, although the plunger can move as far as 7.3 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.5 mm, its loaded force is about 312 gf, namely 11 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 7.3 mm Rated Stroke: 4.5 mm Spring Force: 312�?�±65 gf (11 oz) at load 4.5 mm Materials (plated) Barrel: Brass, Au on Ni Plated Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
PCBA Assembly Test Probe Pogo Pin PQL50 Series Applied to ICT In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe PQL50 series here. Its diameter is 0.78 mm and the total length is 43.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles to fit the probes, for instance, CR, SW, CRW and WW. The plunger can be pressed at a distance of up to 6.35 mm. But it is better to be pressed at a distance of 4.3 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 4.3 mm, the loaded force is about 5.5 oz, 7 oz or 8 oz, which fluctuates to a tolerance. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 60 milliohms Mounting Hole Size: Diameter 1 mm Full Stroke: 6.35 mm Rated Stroke: 4.3 mm Spring Force: 150 gf (5.5 oz)/ 185 gf (7 oz)/ (227 gf (8 oz) Materials Receptacle: Phosphor Bronze, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Electronic Test Probe Double-ended Pogo Pin SCPC030(50)-XX-67 for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPC030(50)-XX-67 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 100 milliohms. The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.8 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.8 mm, the loaded force is about 12 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Ph, Au on Ni Plated Bottom Plunger: BeCu, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 1.5 amps Contact Resistance: 100 milliohms max Bandwidth: 7.5 GHz at -1dB Inductance: 1MHZ at -0.05032 uH Captance: 1MHZ at 0.502464 uF Specifications: Full Stroke: 1 mm Rated Stroke: 0.8 mm Spring Force: 12�?�±3 gf at load 0.8 mm Mechanical Life: about 200000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Switch Probe Pogo Pin SWP298 Series for Electronic Test Switching Probes is a kind of functional probes. They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc. Their application field is mainly as below Wire harness connector PCB component detection Door open-close switch Fixture component detection Automation process sensing Position and retention force
Harness Probe Pogo Pin CH136 Series for the Tests of Automotive Industry Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel. This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 2.67�?� mm at most when this probe works, although the plunger can move as far as 4�?� mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 2.67�?� mm, its loaded force is about 185�?� gf, namely 6.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 4 mm Rated Stroke: 2.67 mm Spring Force: 185 ±55 gf (6.5 oz) at  load 2.67 mm Materials (plated) Barrel: Brass, Au on Ni Plated Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Welcome to browse our website and download any catalogs of our products. �?� Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal
Essential details: Condition: New Warranty: Unavailable Applicable Industries: Manufacturing Plant, Farms, Construction works , Other Weight (KG): 0.05 KG Showroom Location: India Video outgoing-inspection: Not Available Machinery Test Report: Not Available Marketing Type: New Product 2020 Type: Other Use: Tractors Place of Origin: Punjab, India Brand Name: MK After Warranty Service: No service Local Service Location: India Product Name: linch pin Application: Farm Tractor Material: Steel Usage: Tractor Implement Farm Machine Size: Standard Size Name: Agricuture Tyre OEM: Accepable Model Number: Diesel Engine Made Supply Ability: 1000 Piece/Pieces per Month Packaging Details As per order quantity and customer demand. Port: NAVASHIVA
Pogo Pin High-current Probe P350(300) Series for Electronic Test Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc. High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments. High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P350(300). This probe can withstand the current up to 24 Amps. And its typical maximum contact resistance is 70 milliohms. The materials used for the construction of this high-current test probe are different for each component: The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase. The spring is made of gold plated music wire. The plunger is made of beryllium copper, then gold and nickel plated. For details, please check parameters in below table. Technical Specifications Recommended Current Rating: 24 amps, continuous Contact Resistance: 70 milliohms, max Full Stroke: 5.5mm Rated Stroke: 3.6 mm Spring Force: 340 gf at load 3.6 mm Company Information: Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
High-current Probe Pogo Pin P265 Series for Electronic Test Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc. High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments. High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P265. This probe can withstand the current up to 24 Amps. And its typical maximum contact resistance is 50 milliohms. The materials used for the construction of this high-current test probe are different for each component: The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase. The spring is made of gold plated stainless steel. The plunger is made of beryllium copper, then gold and nickel plated. For details, please check parameters in below table. Technical Specifications Recommended Current Rating: 24 amps, continuous Contact Resistance: 50 milliohms, max Full Stroke: 5.3 mm Rated Stroke: 3.5 mm Spring Force: 220 gf (7 oz) at load 3.5 mm Company Information: Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Single-ended Probe Pogo Pin P125 Series for PCBA Test In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits. We will introduce in-circuit test probe P125 series here. Its test center is 125 mil. The diameter is 2.02 mm� and the total length is� 33.28 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, WW and WW-L, to fit each test probe. For details,� please check below parameters. Technical Specifications Recommended Minimum Center: 3.18 mm (125 mil) Current Rating: 3 Amps, continuous Contact Resistance: 30 milliohms Mounting Hole Size: 2.4 mm Full Stroke: 6.35 mm Rated Stroke: 4.32 mm Spring Force: 113/198/255/285 gf (4/7/9/10 oz) Materials Receptacle: Phosphor Bronze, Gold Plated Contact Barrel: Phosphor Bronze, Gold Plated Spring: Music Wire, Gold Plated Plunger: Beryllium Copper, Nickel Plated or Gold Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world. Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal
High-current Probe Pogo Pin P264 Series for Electronic Test Product Description Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness big-current probes, etc. Big-current probes are characterized by high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current. Big-current probes manufactured by Centalic mainly include P203 ( OD of barrel is 2.03 mm. The below is same), P228, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P264-HP-7G(B). The total length of P264-HP-7G(B) is 28.45 mm and outside diameter is 2.64 mm. This probe can withstand up to 24 amps and its typical maximum contact resistance is 50 milliohms. This probe is comprised of a barrel, a plunger and a spring, all of which are plated with gold and nickel. For details, please check below parameters: Technical Specifications: Current rating: 24 amps, continuous Contact resistance: 50 milliohms Full stroke: 5.3 mm Rated stroke: 3.5 mm Spring force: 200gf (7 oz) @ load 3.5 mm Materials (plated): Contact Barrel: Brass, Au on Ni Plated Plunger: Beryllium Copper, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Company information: Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal
High-Current Probe Pogo Pin P420 Series for Electronic Test Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc. High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments. High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P420-HP-19G(C). This probe can withstand the current up to 20 Amps. And its typical maximum contact resistance is 20 milliohms. The materials used for the construction of this high-current test probe are different for each component: our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.
Harness Probe Pogo Pin CHZ136-H(8.4) for the Tests of Automotive Industry Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CHZ136 harness probe we will introduce here is 1.36 mm in diameter and 33.4 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of nickel-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel. This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.3 mm at most when this probe works, although the plunger can move as far as 6.4 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.3 mm, its loaded force is about 113 gf, namely 4 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. Technical Specifications Recommended Current Rating:  3 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 6.4 mm Rated Stroke: 4.3 mm Spring Force: 113 ±33 gf (4 oz) @ load 4.3 mm Materials (plated) Barrel: Brass, Au on Ni Plated Plunger: BeCu, Ni Plated Spring: SW-A/B, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. �?� Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal
Radio Frequency Probe Pogo Pin RPM700 Series for Electronic Test Radio frequency coaxial probes are a type of measurement device used for electronic test equipment to measure radio frequency signals of electronic circuits in silicon wafers, die and open microchips. In addition, RF coaxial probes are used in narrow pitch or high density RF interconnect applications in connector assemblies. Transmission lines used in RF applications are usually coaxial cables connected to circuit boards and microstrip lines inside circuit boards. Features: Low impedance High bandwidth Repeatable measurements Coaxial design Interchangeable inner pin Advantages Low cost Best yield Repeatable accurate test Long lifespan Application Broadband RF measurements PCBA test SMA connectors RF switches etc. There is a fixed schedule for mass production of radio frequency test probe RPM700 we will introduce here. This probe is 33.55 mm in total length  This probe can withstand the current up to 1 Amp. The materials used for the construction of this radio frequency test probe are different for each componen  are plated during the galvanic plating phase. The spring  is  made of gold-plated music wire. For details, please check parameters in below table. Materials (plated) Barrel (1): Brass, Au on Ni Plated Plunger (1): Brass, Au on Ni Plated Barrel (2): Phosphor Bronze, Au on Ni Plated Plunger (2): Beryllium Copper, Au on Ni Plated POM Spring: SWP-A/B, Au on Ni Plated Specifications Full Stroke: 3.5 mm Rated Stroke: 2.3 mm Spring Force: 388 gf at load 2.3 mm Company Information: Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals. Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us. Notice: Stock: standard product. As usual, they are in stock. Express: DHL, FedEx, UPS, etc. Payment: T/T, PayPal
High-Current Probe Pogo Pin P350(150) for Electronic Test Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc. High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments. High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P350(150)-H-14G(C) This probe can withstand the current up to 20 Amps. And its typical maximum contact resistance is 50 milliohms. The materials used for the construction of this high-current test probe are different for each component: The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase. The spring is made of gold plated music wire. The plunger is made of SK4, then gold and nickel plated. The plunger tip is made of brass, then gold and nickel plated. For details, please check parameters in below table. Technical Specifications Recommended Current Rating: 20 amps, continuous Contact Resistance: 50 millohms, max Full Stroke: 7.5 mm Rated Stroke: 5 mm Spring Force: 397 gf at load 5 mm Company Information: in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Wire Harness Probe Pogo Pin CH203 Series for Electronic Test Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CH203 harness probe we will introduce here is 2.03 mm in diameter and 35.9 mm in total length. Its barrel is made of phosphor bronze plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of stainless steel plated with gold and nickel. This probe can withstand up to the current 5 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 5 mm at most when this probe works, although the plunger can move as far as 7.75 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 5 mm, its loaded force is about 145 gf, namely 5.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. Technical Specifications Recommended Current Rating: 5 Amps, continuous Contact Resistance: 50 milliohms Full Stroke: 7.75 mm Rated Stroke: 5 mm Spring Force: 145 ±43 gf (5.5 oz) at load 5 mm Materials (plated) Barrel: Phosphor Bronze, Au on Ni Plated Plunger: BeCu, Au on Ni Plated Spring: SUS, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Wire Harness Probe Pogo Pin CHL165 for the Tests of Automotive Industry Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CHL165 harness probe we will introduce here is 1.65 mm in diameter and 35.4 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel. This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 100 milliohms. It is suggested the plunger be pressed at a distance of 3.5 mm at most when this probe works, although the plunger can move as far as 5.3 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 3.5 mm, its loaded force is about 113 gf, namely 4 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 100 milliohms Full Stroke: 5.3 mm Rated Stroke: 3.5 mm Spring Force: 113�?�±35 gf (4 oz) at load 3.5 mm Materials (plated) Barrel: Brass, Au on Ni Plated Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Cable Harness Probe Pogo Pin CHL265 for the Tests of Automotive Industry Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc. The CHL265 harness probe we will introduce here is 2.65 mm in diameter and 28.4 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel. This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 100 milliohms. It is suggested the plunger be pressed at a distance of 3.5 mm at most when this probe works, although the plunger can move as far as 5.5 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 3.5 mm, its loaded force is about 113 gf, namely 4 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance. Technical Specifications Recommended Current Rating: 3 Amps, continuous Contact Resistance: 100 milliohms Full Stroke: 5.5 mm Rated Stroke: 3.5 mm Spring Force: 113�?�±35 gf (4 oz) at load 3.5 mm Materials (plated) Barrel: Brass, Au on Ni Plated Plunger: BeCu, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Company Information Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Spring Pogo Pin Battery Contact Test Probe BIP94 for Connector Application Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components. Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders. A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity. The products in this page are classified into BIP94 series of battery contact probes. The outside diameter is usually 0.94 mm and there are some common tip styles, for example J. For details, please check below parameters. Technical Specifications Recommended Minimum Center: 1.27 mm (50 mil) Current Rating: 3 Amps, continuous Contact Resistance: 40 milliohms (Maximum) Full Stroke: 0.78 mm Rated Stroke: 0.7 mm Spring Force: 30 gf (1.05 oz) Materials Contact Barrel: Brass, Gold Plated Spring: Music Wire, Gold Plated Plunger: BeCu/SK4, Gold Plated Company information: Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
